{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T15:11:39Z","timestamp":1730301099396,"version":"3.28.0"},"reference-count":22,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/test.2004.1387451","type":"proceedings-article","created":{"date-parts":[[2005,3,21]],"date-time":"2005-03-21T15:07:39Z","timestamp":1111417659000},"page":"1443","source":"Crossref","is-referenced-by-count":1,"title":["How long can we succeed using the OBIRCH and its derivatives?"],"prefix":"10.1109","author":[{"given":"K.","family":"Nikawa","sequence":"first","affiliation":[]}],"member":"263","reference":[{"first-page":"303","year":"1993","author":"nikawa","key":"ref10"},{"first-page":"11","year":"1994","author":"nikawa","key":"ref11"},{"key":"ref12","first-page":"2260","volume":"34","author":"nikawa","year":"1995"},{"first-page":"307","year":"1995","author":"nikawa","key":"ref13"},{"key":"ref14","first-page":"346","author":"nikawa","year":"1996","journal-title":"IRPS IEEE"},{"key":"ref15","first-page":"214","author":"nikawa","year":"1997","journal-title":"ATS IEEE"},{"first-page":"185","year":"1997","author":"nikawa","key":"ref16"},{"first-page":"181","year":"1998","author":"nikawa","key":"ref17"},{"key":"ref18","first-page":"1048","volume":"74","author":"nikawa","year":"1999"},{"first-page":"199","year":"2001","author":"shimase","key":"ref19"},{"key":"ref4","first-page":"579","author":"kawamura","year":"1994","journal-title":"IEICE Trans Electron C"},{"first-page":"43","year":"2001","author":"cole","key":"ref3"},{"key":"ref6","first-page":"529","author":"koyama","year":"2003","journal-title":"IRPS IEEE"},{"key":"ref5","first-page":"228","author":"koyama","year":"1995","journal-title":"IRPS IEEE"},{"first-page":"191","year":"2000","author":"morimoto","key":"ref8"},{"first-page":"223","year":"1999","author":"morimoto","key":"ref7"},{"first-page":"21","year":"2002","author":"bruce","key":"ref2"},{"first-page":"325","year":"2003","author":"arata","key":"ref1"},{"first-page":"193","year":"2001","author":"namura","key":"ref9"},{"first-page":"269","year":"2002","author":"tagami","key":"ref20"},{"key":"ref22","volume":"51","author":"yokogawa","year":"2002","journal-title":"RCJ Reliab Symp"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/S0026-2714(01)00162-7"}],"event":{"name":"International Test Conference 2004","acronym":"TEST-04","location":"Charlotte, NC, USA"},"container-title":["2004 International Conferce on Test"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/9526\/30190\/01387451.pdf?arnumber=1387451","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,14]],"date-time":"2017-03-14T19:25:08Z","timestamp":1489519508000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1387451\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":22,"URL":"https:\/\/doi.org\/10.1109\/test.2004.1387451","relation":{},"subject":[]}}