{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,21]],"date-time":"2025-05-21T06:54:52Z","timestamp":1747810492991},"reference-count":10,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/test.2005.1583971","type":"proceedings-article","created":{"date-parts":[[2006,2,6]],"date-time":"2006-02-06T15:51:40Z","timestamp":1139241100000},"page":"146-155","source":"Crossref","is-referenced-by-count":20,"title":["Burn-in reduction using principal component analysis"],"prefix":"10.1109","author":[{"given":"A.","family":"Nahar","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"R.","family":"Daasch","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.","family":"Subramaniam","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1007\/s13312-011-0043-8"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1207\/s15327906mbr0102_10"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041796"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2002.1011114"},{"key":"7","doi-asserted-by":"crossref","DOI":"10.1007\/978-1-4757-1904-8","author":"jolliffe","year":"1986","journal-title":"Principal Component Analysis"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.2307\/2346300"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.2307\/2346488"},{"journal-title":"Applied multivariate statistical analysis","year":"2002","author":"johnson","key":"4"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1270883"},{"key":"8","first-page":"81","article-title":"Evaluation of effectiveness of median of absolute deviations outlier rejection-based I\/sub DDQ\/ testing for burn-in reduction","author":"sabade","year":"2002","journal-title":"VLSI Test Symposium"}],"event":{"name":"IEEE International Conference on Test, 2005.","location":"Charlotte, NC, USA"},"container-title":["IEEE International Conference on Test, 2005."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/10560\/33431\/01583971.pdf?arnumber=1583971","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,17]],"date-time":"2017-06-17T02:59:33Z","timestamp":1497668373000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1583971\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/test.2005.1583971","relation":{},"subject":[]}}