{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,21]],"date-time":"2025-05-21T05:27:45Z","timestamp":1747805265394,"version":"3.28.0"},"reference-count":13,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/test.2005.1583984","type":"proceedings-article","created":{"date-parts":[[2006,2,6]],"date-time":"2006-02-06T15:51:40Z","timestamp":1139241100000},"page":"266-273","source":"Crossref","is-referenced-by-count":44,"title":["Calibrating clock stretch during AC scan testing"],"prefix":"10.1109","author":[{"given":"J.","family":"Rearick","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"R.","family":"Rodgers","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966682"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1996.557120"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966731"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1992.527892"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1991.519696"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1994.527946"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1997.639716"},{"key":"7","first-page":"694","article-title":"On Delay Fault Testing in Logic Circuits","volume":"cad 6","author":"lin","year":"1987","journal-title":"IEEE Trans Computer-Aided Design"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1994.292299"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1990.114046"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1992.527893"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894231"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/43.238614"}],"event":{"name":"IEEE International Conference on Test, 2005.","location":"Charlotte, NC, USA"},"container-title":["IEEE International Conference on Test, 2005."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/10560\/33431\/01583984.pdf?arnumber=1583984","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,15]],"date-time":"2017-03-15T16:33:33Z","timestamp":1489595613000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1583984\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/test.2005.1583984","relation":{},"subject":[]}}