{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,21]],"date-time":"2025-05-21T06:54:52Z","timestamp":1747810492325},"reference-count":8,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/test.2005.1583986","type":"proceedings-article","created":{"date-parts":[[2006,2,6]],"date-time":"2006-02-06T15:51:40Z","timestamp":1139241100000},"page":"284-293","source":"Crossref","is-referenced-by-count":41,"title":["Microprocessor silicon debug based on failure propagation tracing"],"prefix":"10.1109","author":[{"given":"O.","family":"Caty","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"P.","family":"Dahlgren","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"I.","family":"Bayraktaroglu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1994.527987"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966662"},{"key":"1","first-page":"147","article-title":"Towards Reducing Functional Only Fails for the UltraSPARC Microprocessors","author":"kinra","year":"1999","journal-title":"Proc International Test Conference"},{"key":"7","first-page":"727","article-title":"FakeFault: A Silicon Debug Software Tool for Microprocessors Embedded Memory Arrays","author":"kwon","year":"1998","journal-title":"Proc International Test Conference"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041817"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1270905"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041867"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894264"}],"event":{"name":"IEEE International Conference on Test, 2005.","location":"Charlotte, NC, USA"},"container-title":["IEEE International Conference on Test, 2005."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/10560\/33431\/01583986.pdf?arnumber=1583986","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,15]],"date-time":"2017-03-15T04:16:34Z","timestamp":1489551394000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1583986\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/test.2005.1583986","relation":{},"subject":[]}}