{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T04:44:57Z","timestamp":1725770697338},"reference-count":22,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/test.2005.1583987","type":"proceedings-article","created":{"date-parts":[[2006,2,6]],"date-time":"2006-02-06T10:51:40Z","timestamp":1139223100000},"page":"294-303","source":"Crossref","is-referenced-by-count":30,"title":["Automated mapping of pre-computed module-level test sequences to processor instructions"],"prefix":"10.1109","author":[{"given":"S.","family":"Gurumurthy","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.","family":"Vasudevan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J.A.","family":"Abraham","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"19","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1997.639687"},{"journal-title":"OR 1200 documentation and source code","year":"0","key":"22"},{"key":"17","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1989.82274"},{"key":"18","first-page":"990","article-title":"Native mode functional test generation for processors with applications to self test, and design validation","author":"shen","year":"1998","journal-title":"Proceedings of The International Test Conference"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1109\/EDAC.1991.206393"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041810"},{"key":"13","first-page":"99","article-title":"Automatic functional test program generation for pipelined processors using model checking","author":"mishra","year":"2002","journal-title":"Proc 6th IEEE Int l High-Level Design Validation and Test Workshop"},{"key":"14","doi-asserted-by":"crossref","first-page":"594","DOI":"10.1109\/43.55189","article-title":"Hierarchical test generation using pre-computed tests for modules","author":"murray","year":"1990","journal-title":"IEEE Trans Comput Aided Design Integrated Circuits Systems"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4612-0931-7"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894222"},{"journal-title":"BMC engine of Symbolic Model Verifier","year":"0","key":"21"},{"key":"3","first-page":"193","article-title":"Symbolic model checking wilhout bdds","author":"biere","year":"1999","journal-title":"Proceedings of the 5th International Conference on Tools and Algorithms for Construction and Analysis of Systems"},{"year":"0","key":"20"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/92.736134"},{"year":"0","key":"1"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2003.1240893"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805650"},{"key":"6","first-page":"462","article-title":"A logic design structure for LSI testability","author":"eichelberger","year":"1977","journal-title":"Proc 14th Design Automation Conf"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2003.1253736"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2003.1219068"},{"key":"9","first-page":"1080","article-title":"Test program synthesis for path delay faults in microprocessor cores","author":"lai","year":"2000","journal-title":"Proceedings of The International Test Conference"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2002.998361"}],"event":{"name":"IEEE International Conference on Test, 2005.","location":"Charlotte, NC, USA"},"container-title":["IEEE International Conference on Test, 2005."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/10560\/33431\/01583987.pdf?arnumber=1583987","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,16]],"date-time":"2017-06-16T22:59:33Z","timestamp":1497653973000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1583987\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":22,"URL":"https:\/\/doi.org\/10.1109\/test.2005.1583987","relation":{},"subject":[]}}