{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T00:33:02Z","timestamp":1729643582607,"version":"3.28.0"},"reference-count":19,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/test.2005.1583988","type":"proceedings-article","created":{"date-parts":[[2006,2,6]],"date-time":"2006-02-06T15:51:40Z","timestamp":1139241100000},"page":"304-312","source":"Crossref","is-referenced-by-count":27,"title":["Variance Reduction and Outliers: Statistical Analysis of Semiconductor Test Data"],"prefix":"10.1109","author":[{"given":"W.R.","family":"Daasch","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"R.","family":"Madge","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"19","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2005.1583989"},{"key":"17","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1996.556983"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2004.1299227"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894237"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966731"},{"key":"13","doi-asserted-by":"crossref","first-page":"325","DOI":"10.1023\/A:1023761416156","article-title":"Replacing IDDQ Testing: With Variance Reduction","volume":"19","author":"thibeault","year":"2003","journal-title":"Journal of Electronic Testing Theory and Applications"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041819"},{"key":"11","first-page":"730","article-title":"Clustering Based Techniques for IDDQ Testing","author":"jandhyala","year":"1999","journal-title":"Proceedings International Test Conference"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/IDDQ.1997.633011"},{"year":"0","key":"3"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4615-3146-3"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1997.639607"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805803"},{"year":"0","key":"7"},{"key":"6","doi-asserted-by":"crossref","first-page":"92","DOI":"10.1109\/TEST.2001.966622","article-title":"Neighbor Selection for Variance Reduction in IDDQ and Other Parametric Data","author":"daasch","year":"2001","journal-title":"IEEE International Test Conference"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894206"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1994.527983"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1997.639608"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1145\/989995.989997"}],"event":{"name":"IEEE International Conference on Test, 2005.","location":"Charlotte, NC, USA"},"container-title":["IEEE International Conference on Test, 2005."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/10560\/33431\/01583988.pdf?arnumber=1583988","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,17]],"date-time":"2017-06-17T02:59:33Z","timestamp":1497668373000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1583988\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/test.2005.1583988","relation":{},"subject":[]}}