{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T05:22:50Z","timestamp":1729660970225,"version":"3.28.0"},"reference-count":13,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/test.2005.1583989","type":"proceedings-article","created":{"date-parts":[[2006,2,6]],"date-time":"2006-02-06T15:51:40Z","timestamp":1139241100000},"page":"313-322","source":"Crossref","is-referenced-by-count":13,"title":["Data-driven models for statistical testing: measurements, estimates and residuals"],"prefix":"10.1109","author":[{"given":"W.R.","family":"Daasch","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"R.","family":"Madge","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"year":"0","key":"13"},{"key":"11","doi-asserted-by":"crossref","first-page":"427","DOI":"10.1109\/VTS.2005.38","article-title":"Defect screening using independent component analysis on IDDQ","author":"turakhia","year":"2005","journal-title":"Proceedings VLSI Test Symposium"},{"key":"12","doi-asserted-by":"crossref","first-page":"325","DOI":"10.1023\/A:1023761416156","article-title":"Replacing IDDQ Testing: With Variance Reduction","volume":"19","author":"thibeault","year":"2003","journal-title":"Journal of Electronic Testing Theory and Applications"},{"doi-asserted-by":"publisher","key":"3","DOI":"10.1109\/TEST.2000.894237"},{"doi-asserted-by":"publisher","key":"2","DOI":"10.1109\/TEST.1999.805803"},{"doi-asserted-by":"publisher","key":"1","DOI":"10.1109\/TEST.2005.1583988"},{"doi-asserted-by":"publisher","key":"10","DOI":"10.1109\/TEST.2002.1041819"},{"key":"7","first-page":"302","article-title":"Parametric Variation or Defects? Statistical Post-Processing Analysis of Wafer-Sort Data","author":"daasch","year":"2002","journal-title":"International Symposium for Testing and Failure Analysis"},{"key":"6","doi-asserted-by":"crossref","first-page":"92","DOI":"10.1109\/TEST.2001.966622","article-title":"Neighbor Selection for Variance Reduction in IDDQ and Other Parametric Data","author":"daasch","year":"2001","journal-title":"IEEE International Test Conference"},{"doi-asserted-by":"publisher","key":"5","DOI":"10.1109\/TEST.2000.894206"},{"doi-asserted-by":"publisher","key":"4","DOI":"10.1109\/TEST.1997.639607"},{"key":"9","article-title":"Screening VDSM Outliers using Nominal and Subthreshold Supply Voltage IDDQ","author":"schuermyer","year":"2004","journal-title":"International Test Conference"},{"key":"8","doi-asserted-by":"crossref","first-page":"92","DOI":"10.1109\/TEST.2001.966622","article-title":"Neighbor Selection for Variance Reduction in IDDQ and Other Parametric Data","author":"daasch","year":"2001","journal-title":"IEEE International Test Conference"}],"event":{"name":"IEEE International Conference on Test, 2005.","location":"Charlotte, NC, USA"},"container-title":["IEEE International Conference on Test, 2005."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/10560\/33431\/01583989.pdf?arnumber=1583989","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,4,16]],"date-time":"2019-04-16T19:21:55Z","timestamp":1555442515000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1583989\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/test.2005.1583989","relation":{},"subject":[]}}