{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T08:22:48Z","timestamp":1725783768739},"reference-count":32,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/test.2005.1583993","type":"proceedings-article","created":{"date-parts":[[2006,2,6]],"date-time":"2006-02-06T10:51:40Z","timestamp":1139223100000},"page":"350-358","source":"Crossref","is-referenced-by-count":18,"title":["A random access scan architecture to reduce hardware overhead"],"prefix":"10.1109","author":[{"given":"A.S.","family":"Mudlapur","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"V.D.","family":"Agrawal","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"A.D.","family":"Singh","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"19","doi-asserted-by":"publisher","DOI":"10.1109\/ICVD.2004.1261042"},{"key":"17","doi-asserted-by":"publisher","DOI":"10.1063\/1.1540058"},{"key":"18","first-page":"384","article-title":"Design for Testability in the AMDAHL 580","author":"wagner","year":"1983","journal-title":"Proc Compcon"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1992.527892"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1109\/92.311647"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/43.238614"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1992.527892"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/FTCS.1999.781060"},{"journal-title":"Essentials of Electronic Testing for Digital Memory and Mixed Signal VLSI Circuits","year":"2000","author":"bushnell","key":"12"},{"journal-title":"Hardware Overhead of Boundary Scan and RAS Design Methodologies","year":"0","author":"pli?va","key":"21"},{"key":"20","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1387359"},{"key":"22","article-title":"A Novel Random Access Scan Flip-Flop Design","author":"mudlapur","year":"2005","journal-title":"Proc VLSI Design And Test Symp"},{"key":"23","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1996.510885"},{"key":"24","doi-asserted-by":"publisher","DOI":"10.1109\/43.663826"},{"journal-title":"Testing Semiconductor Memories Theory and Practice","year":"1991","author":"van de goor","key":"25"},{"key":"26","doi-asserted-by":"publisher","DOI":"10.1109\/EDAC.1991.206393"},{"year":"0","key":"27"},{"key":"28","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805616"},{"key":"29","first-page":"133","article-title":"Power Reduction in Test-Per-Scan BIST","author":"zliang","year":"2000","journal-title":"Proc On-Line Testing Workshop"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/ICVD.1994.282700"},{"year":"0","key":"2"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1270872"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/54.2032"},{"key":"30","doi-asserted-by":"publisher","DOI":"10.1109\/FTCSH.1995.532648"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2000.843824"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.1997.597219"},{"key":"32","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1981.1675757"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1145\/378239.378396"},{"key":"31","doi-asserted-by":"publisher","DOI":"10.1023\/A:1008247801050"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/92.585217"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/43.736572"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2002.1011128"}],"event":{"name":"IEEE International Conference on Test, 2005.","location":"Charlotte, NC, USA"},"container-title":["IEEE International Conference on Test, 2005."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/10560\/33431\/01583993.pdf?arnumber=1583993","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,15]],"date-time":"2017-03-15T12:18:45Z","timestamp":1489580325000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1583993\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":32,"URL":"https:\/\/doi.org\/10.1109\/test.2005.1583993","relation":{},"subject":[]}}