{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,19]],"date-time":"2025-03-19T13:13:27Z","timestamp":1742390007473},"reference-count":29,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/test.2005.1584012","type":"proceedings-article","created":{"date-parts":[[2006,2,6]],"date-time":"2006-02-06T10:51:40Z","timestamp":1139223100000},"page":"517-526","source":"Crossref","is-referenced-by-count":13,"title":["A vector-based approach for power supply noise analysis in test compaction"],"prefix":"10.1109","author":[{"family":"Jing Wang","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Ziding Yue","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Xiang Lu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Wangqi Qiu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Weiping Shi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"D.M.H.","family":"Walker","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"19","doi-asserted-by":"publisher","DOI":"10.1145\/775832.775862"},{"key":"17","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2000.855295"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1145\/775832.775860"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2000.843824"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2004.1382687"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2005.77"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1271098"},{"key":"11","first-page":"184","article-title":"Vectorless Analysis of Supply Noise Induced Delay Variation","author":"pant","year":"2003","journal-title":"IEEE\/ACM International Conference on Computer Aided Design"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/43.913759"},{"journal-title":"Experimental Designs","year":"1957","author":"cochran","key":"21"},{"key":"20","doi-asserted-by":"publisher","DOI":"10.1109\/81.883330"},{"key":"22","article-title":"Advanced Waveform Models for the Nanometer Regime","author":"nassif","year":"2004","journal-title":"Proc ACM\/IEEE Int Workshop Timing Issues (TAU)"},{"key":"23","doi-asserted-by":"publisher","DOI":"10.1145\/378239.378489"},{"key":"24","doi-asserted-by":"publisher","DOI":"10.1109\/43.124404"},{"key":"25","doi-asserted-by":"publisher","DOI":"10.1145\/240518.240558"},{"year":"0","key":"26"},{"key":"27","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1386956"},{"key":"28","doi-asserted-by":"publisher","DOI":"10.1109\/ICVD.2004.1260984"},{"key":"29","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1386956"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1145\/309847.310053"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1996.569906"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2003.1253657"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1270886"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.1997.597223"},{"key":"6","first-page":"110","article-title":"Analysis of Ground Bounce in Deep Sub-Micron Circuits","author":"chang","year":"1997","journal-title":"IEEE VLSI Test Symposium"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2003.159687"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2004.1269036"},{"key":"9","first-page":"179","article-title":"Model and Analysis of Combined Package and on-Chip Power Grid Simulation","author":"panda","year":"2000","journal-title":"International Symposium on Low Power Electronics and Design"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2003.811442"}],"event":{"name":"IEEE International Conference on Test, 2005.","location":"Charlotte, NC, USA"},"container-title":["IEEE International Conference on Test, 2005."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/10560\/33431\/01584012.pdf?arnumber=1584012","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,14]],"date-time":"2017-03-14T16:40:31Z","timestamp":1489509631000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1584012\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":29,"URL":"https:\/\/doi.org\/10.1109\/test.2005.1584012","relation":{},"subject":[]}}