{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T18:22:28Z","timestamp":1725474148387},"reference-count":22,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/test.2005.1584039","type":"proceedings-article","created":{"date-parts":[[2006,2,6]],"date-time":"2006-02-06T10:51:40Z","timestamp":1139223100000},"page":"762-770","source":"Crossref","is-referenced-by-count":0,"title":["An optimal test pattern selection method to improve the defect coverage"],"prefix":"10.1109","author":[{"family":"Yuxin Tian","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.R.","family":"Grimailay","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Weiping Shi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.R.","family":"Mercer","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"19","DOI":"10.1109\/TEST.1991.519523"},{"key":"22","article-title":"Paralleler und Objektorientierter Simplex-Algorithmus","author":"wunderling","year":"1996","journal-title":"ZIB Tech Report"},{"doi-asserted-by":"publisher","key":"17","DOI":"10.1016\/0022-0000(88)90003-7"},{"doi-asserted-by":"publisher","key":"18","DOI":"10.1109\/VTEST.1996.510889"},{"year":"0","key":"15"},{"doi-asserted-by":"publisher","key":"16","DOI":"10.1109\/ATS.2002.1181677"},{"doi-asserted-by":"publisher","key":"13","DOI":"10.1109\/TCAD.2003.811442"},{"doi-asserted-by":"publisher","key":"14","DOI":"10.1109\/TEST.1995.529895"},{"key":"11","first-page":"105","article-title":"PROBE: A PPSFP simulator for resistive bridging faults","author":"lee","year":"2000","journal-title":"Proc VLSI Test Symposium"},{"doi-asserted-by":"publisher","key":"12","DOI":"10.1145\/944027.944036"},{"key":"21","doi-asserted-by":"crossref","DOI":"10.1007\/978-1-4757-5662-3","author":"vanderbei","year":"2001","journal-title":"Linear Programming Foundations and Extensions"},{"doi-asserted-by":"publisher","key":"3","DOI":"10.1109\/TEST.2000.894304"},{"key":"20","first-page":"404","article-title":"An evaluation of pseudo random testing for detecting real defects","author":"tseng","year":"2001","journal-title":"Proc VLSI Test Symposium"},{"doi-asserted-by":"publisher","key":"2","DOI":"10.1109\/DAC.2000.855293"},{"year":"2000","author":"bushnell","journal-title":"Essentials of Electronic Testing for Digital Memory and Mixed-Signal VLSI Circuits","key":"1"},{"key":"10","doi-asserted-by":"crossref","DOI":"10.1007\/978-1-4615-5597-1","author":"krstic","year":"1998","journal-title":"Delay Fault Testing for VLSI Circuits"},{"doi-asserted-by":"publisher","key":"7","DOI":"10.1145\/502175.502186"},{"year":"1968","author":"feller","journal-title":"An Introduction to Probability Theory and Its Applications","key":"6"},{"doi-asserted-by":"publisher","key":"5","DOI":"10.1109\/43.936380"},{"doi-asserted-by":"publisher","key":"4","DOI":"10.1109\/54.902820"},{"doi-asserted-by":"publisher","key":"9","DOI":"10.1109\/TEST.1992.527898"},{"doi-asserted-by":"publisher","key":"8","DOI":"10.1109\/VTEST.1999.766675"}],"event":{"name":"IEEE International Conference on Test, 2005.","location":"Charlotte, NC, USA"},"container-title":["IEEE International Conference on Test, 2005."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/10560\/33431\/01584039.pdf?arnumber=1584039","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,4,16]],"date-time":"2019-04-16T15:22:00Z","timestamp":1555428120000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1584039\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":22,"URL":"https:\/\/doi.org\/10.1109\/test.2005.1584039","relation":{},"subject":[]}}