{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T08:57:49Z","timestamp":1729673869270,"version":"3.28.0"},"reference-count":29,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/test.2005.1584072","type":"proceedings-article","created":{"date-parts":[[2006,2,6]],"date-time":"2006-02-06T15:51:40Z","timestamp":1139241100000},"page":"1059-1066","source":"Crossref","is-referenced-by-count":2,"title":["Synthesis of non-intrusive concurrent error detection using an even error detecting function"],"prefix":"10.1109","author":[{"given":"A.","family":"Dutta","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"N.A.","family":"Touba","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"19","doi-asserted-by":"publisher","DOI":"10.1023\/A:1008244815697"},{"key":"17","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1998.743195"},{"key":"18","first-page":"141","article-title":"New Self-Checking Circuits by Use of Berger-Codes","author":"morozov","year":"2000","journal-title":"Proc On-Line Testing Workshop"},{"key":"15","doi-asserted-by":"crossref","first-page":"35","DOI":"10.1109\/OLT.2003.1214364","article-title":"Synthesis of Low-Cost Parity-Based Partially Self-Checking Circuits","author":"mohanram","year":"2003","journal-title":"Proc Int On-Line Test Symp"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1271075"},{"journal-title":"Error Detection Circuits","year":"1993","author":"go?ssel","key":"13"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/43.229762"},{"key":"11","doi-asserted-by":"crossref","first-page":"167","DOI":"10.1109\/VTEST.1994.292318","article-title":"Delay Testing of Digital Circuits","author":"franco","year":"1994","journal-title":"Proc VLSI Test Symposium"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1987.5009451"},{"key":"21","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1996.510852"},{"key":"20","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1999.766651"},{"key":"22","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.1998.741628"},{"key":"23","doi-asserted-by":"publisher","DOI":"10.1023\/A:1008257118423"},{"key":"24","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2002.1028924"},{"key":"25","first-page":"280","article-title":"Design of Built-in Self-Checking Monitoring Circuits for Combinational Devices","volume":"35","author":"sogomonvan","year":"1974","journal-title":"Automation and Remote Control"},{"key":"26","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.1994.367258"},{"key":"27","doi-asserted-by":"publisher","DOI":"10.1109\/43.644041"},{"year":"0","key":"28"},{"key":"29","doi-asserted-by":"publisher","DOI":"10.1147\/rd.401.0003"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2004.1299259"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2004.1283716"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/54.990438"},{"key":"1","first-page":"99","article-title":"New Methods for Evaluating the Impact of Single Event Transients in VDSM ICs","author":"alexandrescu","year":"2002","journal-title":"Proc Int Symp Defect Fault Tolerance"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.1999.824159"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/EDTC.1997.582397"},{"key":"5","doi-asserted-by":"crossref","first-page":"299","DOI":"10.1142\/S0129156404002363","article-title":"Soft errors in commercial integrated circuits","volume":"14","author":"bowman","year":"2004","journal-title":"International Journal of High Speed Computing"},{"key":"4","first-page":"4","article-title":"Technology scaling trends and accelerated testing for soft errors in commercial silicon devices","author":"bowman","year":"2003","journal-title":"Proc IEEE International On-Line Testing Symposium"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/92.285745"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1023\/A:1008344603814"}],"event":{"name":"IEEE International Conference on Test, 2005.","location":"Charlotte, NC, USA"},"container-title":["IEEE International Conference on Test, 2005."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/10560\/33431\/01584072.pdf?arnumber=1584072","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,17]],"date-time":"2017-06-17T02:59:34Z","timestamp":1497668374000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1584072\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":29,"URL":"https:\/\/doi.org\/10.1109\/test.2005.1584072","relation":{},"subject":[]}}