{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,19]],"date-time":"2025-03-19T15:59:40Z","timestamp":1742399980429},"reference-count":6,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/test.2005.1584081","type":"proceedings-article","created":{"date-parts":[[2006,2,6]],"date-time":"2006-02-06T10:51:40Z","timestamp":1139223100000},"page":"1136-1144","source":"Crossref","is-referenced-by-count":1,"title":["A novel test methodology based on error-rate to support error-tolerance"],"prefix":"10.1109","author":[{"family":"Kuen-Jong Lee","sequence":"first","affiliation":[]},{"family":"Tong-Yu Hsieh","sequence":"additional","affiliation":[]},{"given":"M.A.","family":"Breuer","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"year":"2003","key":"3"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2004.51"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2004.8"},{"journal-title":"Fundamentals of Probability 2\/P","year":"2000","author":"ghahramani","key":"6"},{"journal-title":"Essentials of Electronic Testing For Digital Memory & Mixed-Signal VLSI Circuits","year":"2000","author":"bushnell","key":"5"},{"key":"4","doi-asserted-by":"crossref","first-page":"824","DOI":"10.1109\/TEST.2002.1041836","article-title":"An ATPG for threshold testing: Obtaining acceptable yield in future processes","author":"jiang","year":"2002","journal-title":"Proc Int'l Test Conf"}],"event":{"name":"IEEE International Conference on Test, 2005.","location":"Charlotte, NC, USA"},"container-title":["IEEE International Conference on Test, 2005."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/10560\/33431\/01584081.pdf?arnumber=1584081","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,16]],"date-time":"2017-06-16T22:59:34Z","timestamp":1497653974000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1584081\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":6,"URL":"https:\/\/doi.org\/10.1109\/test.2005.1584081","relation":{},"subject":[]}}