{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T23:54:49Z","timestamp":1729641289652,"version":"3.28.0"},"reference-count":32,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/test.2005.1584091","type":"proceedings-article","created":{"date-parts":[[2006,2,6]],"date-time":"2006-02-06T10:51:40Z","timestamp":1139223100000},"page":"1227-1235","source":"Crossref","is-referenced-by-count":3,"title":["An advanced optical diagnostic technique of IBM z990 eserver microprocessor"],"prefix":"10.1109","author":[{"family":"Peilin Song","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"F.","family":"Stellari","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"B.","family":"Huott","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"O.","family":"Wagner","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"U.","family":"Srinivasan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Yuen Chan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"R.","family":"Rizzolo","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"H.J.","family":"Nam","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J.","family":"Eckhardt","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"T.","family":"McNamara","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Ching-Lung Tong","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"A.","family":"Weger","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"McManus","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"19","doi-asserted-by":"publisher","DOI":"10.1109\/43.3952"},{"key":"17","first-page":"69","article-title":"Fault Diagnosis Based on Effect-Cause Analysis","author":"abramovici","year":"1987","journal-title":"Proceedings of Design Automation Conference"},{"key":"18","first-page":"480","article-title":"Diagnosis of BIST Failures by PPSFT Simulation","author":"waicukauski","year":"1987","journal-title":"Proc 1987 IEEE Int Test Conf"},{"journal-title":"Digital Systems Testing and Testable Design","year":"1990","author":"abramovici","key":"15"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.1981.1585459"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1147\/rd.261.0078"},{"key":"14","first-page":"561","article-title":"Fast Fault Diagnostic Method Using Fault Dictionary for Electron Beam Tester","author":"yano","year":"1987","journal-title":"Proc 1987 IEEE Int Test Conf"},{"key":"11","doi-asserted-by":"crossref","first-page":"352","DOI":"10.1109\/TC.1968.229394","article-title":"fault testing and diagnosis in combinational digital circuits","volume":"c 17","author":"kautz","year":"1968","journal-title":"IEEE Transactions on Computers"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/T-C.1972.223427"},{"key":"21","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805841"},{"key":"20","doi-asserted-by":"publisher","DOI":"10.1109\/54.32421"},{"journal-title":"Encounter Diagnostics","year":"0","author":"design systems","key":"22"},{"year":"0","key":"23"},{"key":"24","first-page":"197","article-title":"Timing Analysis of a Microprocessor PLL using High Quantum Efficiency Superconducting Single Photon Detector (SSPD)","author":"song","year":"2004","journal-title":"Proc Int Symposium on Testing and Failure Analysis"},{"key":"25","first-page":"200","article-title":"Self-Testing of Multichip Modules","author":"bardell","year":"1982","journal-title":"Proceedings of the IEEE International Test Conference"},{"key":"26","doi-asserted-by":"publisher","DOI":"10.1147\/rd.414.0611"},{"key":"27","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805841"},{"key":"28","first-page":"753","article-title":"Next-Generation Optical Probing Tools for Design Debug of High Speed Integrated Circuits","author":"lo","year":"2002","journal-title":"International Symposium for Testing and Failure Analysis"},{"key":"29","doi-asserted-by":"publisher","DOI":"10.1063\/1.1139358"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1992.232749"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/55.596927"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966642"},{"key":"1","first-page":"295","article-title":"The IBM eServer z990 microprocessor","author":"siegel","year":"2004","journal-title":"IBM J Res Develop"},{"key":"30","article-title":"Testing of Ultra Low Voltage VLSI Chips using the Superconducting Single-Photon Detector (SSPD)","author":"stellari","year":"2004","journal-title":"European Symposium on Reliability of Electron Devices"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/DFTVS.1998.732169"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1995.512645"},{"key":"32","doi-asserted-by":"publisher","DOI":"10.1063\/1.1388868"},{"key":"5","first-page":"14","article-title":"A new scan structure for improving scan chain diagnosis and delay fault coverage","author":"song","year":"2000","journal-title":"Proc NATW"},{"key":"31","first-page":"276","article-title":"Backside infrared probing for static voltage drop and dynamic timing measurements","author":"rusu","year":"2001","journal-title":"International Solid-State Circuits Conference"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1997.639683"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/54.970425"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1993.313363"}],"event":{"name":"IEEE International Conference on Test, 2005.","location":"Charlotte, NC, USA"},"container-title":["IEEE International Conference on Test, 2005."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/10560\/33431\/01584091.pdf?arnumber=1584091","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,16]],"date-time":"2017-06-16T22:59:35Z","timestamp":1497653975000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1584091\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":32,"URL":"https:\/\/doi.org\/10.1109\/test.2005.1584091","relation":{},"subject":[]}}