{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,3]],"date-time":"2024-09-03T17:23:02Z","timestamp":1725384182020},"reference-count":25,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2007]]},"DOI":"10.1109\/test.2007.4437572","type":"proceedings-article","created":{"date-parts":[[2008,1,29]],"date-time":"2008-01-29T20:41:30Z","timestamp":1201639290000},"page":"1-9","source":"Crossref","is-referenced-by-count":0,"title":["Test-wrapper designs for the detection of signal-integrity faults on core-external interconnects of SoCs"],"prefix":"10.1109","author":[{"family":"Qiang Xu","sequence":"first","affiliation":[]},{"family":"Yubin Zhang","sequence":"additional","affiliation":[]},{"family":"Krishnendu Chakrabarty","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"19","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1998.670845"},{"key":"17","doi-asserted-by":"publisher","DOI":"10.1109\/IITC.2005.1499928"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1145\/1127908.1127967"},{"year":"0","key":"15"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1023\/A:1016545607915"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/4.508215"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1145\/1120725.1120800"},{"year":"0","key":"11"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.1994.307855"},{"journal-title":"Digital Integrated Circuits A Design Perspective","year":"2003","author":"rabaey","key":"21"},{"key":"20","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2002.804491"},{"key":"22","first-page":"163","article-title":"enhanced crosstalk fault model and methodology to generate tests for arbitrary inter-core interconnect topology","author":"sirisaengtaksin","year":"2002","journal-title":"Proceedings IEEE Asian Test Symposium (ATS)"},{"key":"23","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2003.1197647"},{"key":"24","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2004.826540"},{"key":"25","doi-asserted-by":"crossref","first-page":"491","DOI":"10.1109\/TEST.2002.1041799","article-title":"on-line testing of multi-source noise-induced errors on the interconnects and buses of system-on-chips","author":"zhao","year":"2002","journal-title":"Proceedings IEEE International Test Conference (ITC)"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2004.825855"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1270831"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1998.144269"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2004.831568"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.1999.761620"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/43.920689"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2001.156158"},{"year":"0","key":"4"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1999.810665"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2003.821565"}],"event":{"name":"2007 IEEE International Test Conference","start":{"date-parts":[[2007,10,21]]},"location":"Santa Clara, CA, USA","end":{"date-parts":[[2007,10,26]]}},"container-title":["2007 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4437545\/4437546\/04437572.pdf?arnumber=4437572","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,18]],"date-time":"2017-06-18T03:33:09Z","timestamp":1497756789000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4437572\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2007]]},"references-count":25,"URL":"https:\/\/doi.org\/10.1109\/test.2007.4437572","relation":{},"subject":[],"published":{"date-parts":[[2007]]}}}