{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,21]],"date-time":"2025-05-21T06:55:22Z","timestamp":1747810522546,"version":"3.33.0"},"reference-count":22,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2007]]},"DOI":"10.1109\/test.2007.4437575","type":"proceedings-article","created":{"date-parts":[[2008,1,29]],"date-time":"2008-01-29T20:41:30Z","timestamp":1201639290000},"page":"1-10","source":"Crossref","is-referenced-by-count":44,"title":["Fully X-tolerant combinational scan compression"],"prefix":"10.1109","author":[{"given":"P.","family":"Wohl","sequence":"first","affiliation":[]},{"given":"J.A.","family":"Waicukauski","sequence":"additional","affiliation":[]},{"given":"S.","family":"Ramnath","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"19","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2005.1584076"},{"key":"22","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2002.1167548"},{"key":"17","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2003.1197640"},{"year":"0","key":"18"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1386979"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2003.1197639"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966618"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041774"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2003.159776"},{"key":"12","article-title":"a probabilistic analysis of test-response compaction","author":"pilarski","year":"1995","journal-title":"IEEE Computer Society Press"},{"key":"21","doi-asserted-by":"crossref","DOI":"10.1093\/oso\/9780198535768.001.0001","author":"colbourn","year":"1999","journal-title":"Triple Systems"},{"journal-title":"Structured Logic Testing","year":"1991","author":"eichelberger","key":"3"},{"key":"20","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2005.81"},{"journal-title":"Digital Systems Testing and Testable Design","year":"1990","author":"abramovici","key":"2"},{"journal-title":"International Technology Roadmap for Semiconductors (ITRS)","year":"0","key":"1"},{"key":"10","article-title":"h-dft: a hybrid dft architecture for low-cost high-quality structural testing","author":"wu","year":"2003","journal-title":"International Test Conference"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966696"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2007.38"},{"journal-title":"Built-In Test for VLSI Pseudorandom Techniques","year":"1987","author":"bardell","key":"5"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805650"},{"year":"0","key":"9"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/FTCS.1999.781060"}],"event":{"name":"2007 IEEE International Test Conference","start":{"date-parts":[[2007,10,21]]},"location":"Santa Clara, CA, USA","end":{"date-parts":[[2007,10,26]]}},"container-title":["2007 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4437545\/4437546\/04437575.pdf?arnumber=4437575","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,1,26]],"date-time":"2025-01-26T11:12:57Z","timestamp":1737889977000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4437575\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2007]]},"references-count":22,"URL":"https:\/\/doi.org\/10.1109\/test.2007.4437575","relation":{},"subject":[],"published":{"date-parts":[[2007]]}}}