{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,12]],"date-time":"2026-06-12T21:05:06Z","timestamp":1781298306092,"version":"3.54.1"},"reference-count":19,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2007]]},"DOI":"10.1109\/test.2007.4437577","type":"proceedings-article","created":{"date-parts":[[2008,1,29]],"date-time":"2008-01-29T15:41:30Z","timestamp":1201621290000},"page":"1-9","source":"Crossref","is-referenced-by-count":7,"title":["Using timing flexibility of automatic test equipment to complement X-tolerant test compression techniques"],"prefix":"10.1109","author":[{"given":"Andreas","family":"Leininger","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Martin","family":"Fischer","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Michael","family":"Braun","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Michael","family":"Richter","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Michael","family":"Goessel","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"19","author":"volkerink","year":"0","journal-title":"D 'Test economics for multi-site test with modern cost reduction"},{"key":"17","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2006.229401"},{"key":"18","doi-asserted-by":"crossref","DOI":"10.1109\/TEST.2005.1584060","article-title":"ultrascan: using time-division demultiplexing\/multiplexing (tddm\/tdm) with virtualscan for test cost reduction","author":"wang","year":"2005","journal-title":"Test Conference 2005 Proceedings ITC"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2003.159775"},{"key":"16","year":"0"},{"key":"13","first-page":"59","article-title":"on efficient x-handling using a selective compaction scheme to achieve high test response compaction ratios","author":"tang","year":"2005","journal-title":"VLSI Design 2005 18th International Conference on"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2005.193784"},{"key":"11","year":"0"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041773"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2005.38"},{"key":"2","first-page":"748","article-title":"opmisr: the foundation for compressed atpg vectors","author":"barnhart","year":"2001","journal-title":"Proc Int Test Conf 2001"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2002.1033794"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2005.81"},{"key":"7","year":"0"},{"key":"6","doi-asserted-by":"crossref","first-page":"1","DOI":"10.1109\/TEST.2006.297643","article-title":"x-press compactor for 1000x reduction of test data","author":"rajski","year":"2006","journal-title":"Test Conference 2006 Proceedings International"},{"key":"5","year":"0"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2005.1560044"},{"key":"9","year":"0"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2006.229402"}],"event":{"name":"2007 IEEE International Test Conference","location":"Santa Clara, CA, USA","start":{"date-parts":[[2007,10,21]]},"end":{"date-parts":[[2007,10,26]]}},"container-title":["2007 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4437545\/4437546\/04437577.pdf?arnumber=4437577","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,6,12]],"date-time":"2026-06-12T20:53:53Z","timestamp":1781297633000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4437577\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2007]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/test.2007.4437577","relation":{},"subject":[],"published":{"date-parts":[[2007]]}}}