{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,25]],"date-time":"2026-02-25T17:57:17Z","timestamp":1772042237022,"version":"3.50.1"},"reference-count":16,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2007]]},"DOI":"10.1109\/test.2007.4437578","type":"proceedings-article","created":{"date-parts":[[2008,1,29]],"date-time":"2008-01-29T20:41:30Z","timestamp":1201639290000},"page":"1-10","source":"Crossref","is-referenced-by-count":14,"title":["Diagnose compound scan chain and system logic defects"],"prefix":"10.1109","author":[{"family":"Yu Huang","sequence":"first","affiliation":[]},{"family":"Will Hsu","sequence":"additional","affiliation":[]},{"family":"Yuan-Shih Chen","sequence":"additional","affiliation":[]},{"family":"Wu-Tung Cheng","sequence":"additional","affiliation":[]},{"family":"Ruifeng Guo","sequence":"additional","affiliation":[]},{"given":"Albert","family":"Man","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"15","doi-asserted-by":"publisher","DOI":"10.1109\/DFTVS.1998.732169"},{"key":"16","first-page":"157","article-title":"quick scan chain diagnosis using signal profiling","author":"yang","year":"2005","journal-title":"Proc of Int'l Conf On Computer Design"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1992.232749"},{"key":"14","doi-asserted-by":"crossref","first-page":"558","DOI":"10.1109\/TCAD.2005.854624","article-title":"analysis and methodology for multiple-fault diagnosis","volume":"25","author":"wang","year":"2006","journal-title":"IEEE Trans on CAD"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1997.639683"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041773"},{"key":"3","first-page":"16","article-title":"debugging and diagnosing scan chains","volume":"7","author":"crouch","year":"2005","journal-title":"EDFAS"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2004.32"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1990.114096"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/92.335019"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1270854"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2001.923415"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966642"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1995.512645"},{"key":"9","author":"huang","year":"2005","journal-title":"Compressed Pattern Diagnosis For Scan Chain Failures"},{"key":"8","article-title":"diagnosing dacs (defects that affect scan chain and system logic)","author":"huang","year":"2004","journal-title":"ISTFA"}],"event":{"name":"2007 IEEE International Test Conference","location":"Santa Clara, CA, USA","start":{"date-parts":[[2007,10,21]]},"end":{"date-parts":[[2007,10,26]]}},"container-title":["2007 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4437545\/4437546\/04437578.pdf?arnumber=4437578","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,18]],"date-time":"2017-06-18T03:33:09Z","timestamp":1497756789000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4437578\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2007]]},"references-count":16,"URL":"https:\/\/doi.org\/10.1109\/test.2007.4437578","relation":{},"subject":[],"published":{"date-parts":[[2007]]}}}