{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,4]],"date-time":"2025-11-04T10:15:50Z","timestamp":1762251350746,"version":"3.28.0"},"reference-count":28,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2007]]},"DOI":"10.1109\/test.2007.4437579","type":"proceedings-article","created":{"date-parts":[[2008,1,29]],"date-time":"2008-01-29T15:41:30Z","timestamp":1201621290000},"page":"1-10","source":"Crossref","is-referenced-by-count":4,"title":["A complete test set to diagnose scan chain failures"],"prefix":"10.1109","author":[{"family":"Ruifeng Guo","sequence":"first","affiliation":[]},{"family":"Yu Huang","sequence":"additional","affiliation":[]},{"family":"Wu-Tung Cheng","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"journal-title":"Diagnosis with Limited Failure Information","year":"2006","author":"huang","key":"19"},{"key":"17","first-page":"510","article-title":"diagnosis of multiple scan chain faults","author":"kong","year":"2005","journal-title":"Proc Int Symp Testing and Failure Analysis"},{"key":"18","first-page":"1861","article-title":"an algorithmic technique for diagnosis of faulty scan chains","author":"guo","year":"2006","journal-title":"IEEE Trans on CAD"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2005.848800"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2005.182"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1145\/1120725.1120934"},{"key":"14","first-page":"16","article-title":"debugging and diagnosing scan chains","volume":"7","author":"crouch","year":"2005","journal-title":"EDFAS"},{"key":"11","first-page":"319","author":"huang","year":"2003","journal-title":"Statistical Diagnosis for Intermittent Scan Chain Hold-Time Fault"},{"year":"0","key":"12"},{"article-title":"look ahead scan chain diagnostic method","year":"2001","author":"forlenza","key":"21"},{"article-title":"flip-flop design and technique for scan chain diagnosis","year":"1999","author":"narayanan","key":"20"},{"article-title":"stuck-at fault scan chain diagnostic method","year":"2003","author":"motika","key":"22"},{"article-title":"stuck and transient fault diagnostic system","year":"2004","author":"stanley","key":"23"},{"article-title":"method, apparatus, and computer program product for implementing deterministic based broken scan chain diagnostics","year":"2005","author":"anderson","key":"24"},{"article-title":"diagnostic method for structural scan chain designs","year":"2005","author":"motika","key":"25"},{"article-title":"method for optimizing a set of scan diagnostic patterns","year":"2006","author":"brunkhorst","key":"26"},{"key":"27","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041773"},{"journal-title":"Compressed Pattern Diagnosis For Scan Chain Failures","year":"2005","author":"huang","key":"28"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1995.512645"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/92.335019"},{"key":"10","first-page":"268","author":"guo","year":"2001","journal-title":"A Technique For Fault Diagnosis of Defects in Scan Chains ITC"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1992.232749"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805841"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/DFTVS.1998.732169"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1997.639683"},{"key":"4","first-page":"636","author":"de","year":"1995","journal-title":"Failure Analysis for Full-Scan Circuits"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/54.970425"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.1999.810744"}],"event":{"name":"2007 IEEE International Test Conference","start":{"date-parts":[[2007,10,21]]},"location":"Santa Clara, CA, USA","end":{"date-parts":[[2007,10,26]]}},"container-title":["2007 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4437545\/4437546\/04437579.pdf?arnumber=4437579","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,16]],"date-time":"2017-03-16T18:50:47Z","timestamp":1489690247000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4437579\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2007]]},"references-count":28,"URL":"https:\/\/doi.org\/10.1109\/test.2007.4437579","relation":{},"subject":[],"published":{"date-parts":[[2007]]}}}