{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,12]],"date-time":"2026-06-12T21:03:32Z","timestamp":1781298212993,"version":"3.54.1"},"reference-count":18,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2007]]},"DOI":"10.1109\/test.2007.4437587","type":"proceedings-article","created":{"date-parts":[[2008,1,29]],"date-time":"2008-01-29T15:41:30Z","timestamp":1201621290000},"page":"1-10","source":"Crossref","is-referenced-by-count":14,"title":["Analyzing the risk of timing modeling based on path delay tests."],"prefix":"10.1109","author":[{"given":"Pouria","family":"Bastani","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Benjamin N.","family":"Lee","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Li-C.","family":"Wang","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Savithri","family":"Sundareswaran","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Magdy S.","family":"Abadir","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"17","doi-asserted-by":"publisher","DOI":"10.1007\/BF00058655"},{"key":"18","first-page":"331","article-title":"First-order incremental block-based statistical timing analysis","author":"visweswariah","year":"2004","journal-title":"Proceedings 41st Design Automation Conference 2004 DAC"},{"key":"15","year":"0"},{"key":"16","year":"0"},{"key":"13","author":"vapnik","year":"1999","journal-title":"The Nature of Statistical Learning Theory"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1145\/1143844.1143865"},{"key":"11","author":"quirk","year":"2001","journal-title":"Semiconductor Manufacturing Technology"},{"key":"12","year":"0"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1271092"},{"key":"2","first-page":"758","author":"hsu","year":"1998","journal-title":"A new path-oriented effect-cause methodology to diagnose delay failures"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.1980.1585231"},{"key":"10","article-title":"estimation of the correlation coefficient using the bayesian approach and its applications for epidemiologic research","volume":"3","author":"schisterma","year":"2003","journal-title":"BMCMedical Research Methodology"},{"key":"7","year":"0"},{"key":"6","year":"0"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1049\/ip-cdt:20030834"},{"key":"4","doi-asserted-by":"crossref","DOI":"10.1007\/978-1-4615-5597-1","author":"kristic","year":"1998","journal-title":"Delay Fault Testing for VLSI Circuits"},{"key":"9","year":"0"},{"key":"8","doi-asserted-by":"crossref","DOI":"10.1007\/978-0-387-21606-5","article-title":"the elements of statistical learning","author":"hastie","year":"2001","journal-title":"Springer series in statistics"}],"event":{"name":"2007 IEEE International Test Conference","location":"Santa Clara, CA, USA","start":{"date-parts":[[2007,10,21]]},"end":{"date-parts":[[2007,10,26]]}},"container-title":["2007 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4437545\/4437546\/04437587.pdf?arnumber=4437587","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,6,12]],"date-time":"2026-06-12T20:53:52Z","timestamp":1781297632000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4437587\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2007]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/test.2007.4437587","relation":{},"subject":[],"published":{"date-parts":[[2007]]}}}