{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,29]],"date-time":"2025-09-29T12:02:04Z","timestamp":1759147324367},"reference-count":22,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2007]]},"DOI":"10.1109\/test.2007.4437598","type":"proceedings-article","created":{"date-parts":[[2008,1,29]],"date-time":"2008-01-29T20:41:30Z","timestamp":1201639290000},"page":"1-9","source":"Crossref","is-referenced-by-count":13,"title":["PMScan : A power-managed scan for simultaneous reduction of dynamic and leakage power during scan test"],"prefix":"10.1109","author":[{"given":"V.R.","family":"Devanathan","sequence":"first","affiliation":[]},{"given":"C.P.","family":"Ravikumar","sequence":"additional","affiliation":[]},{"family":"Rajat Mehrotra","sequence":"additional","affiliation":[]},{"given":"V.","family":"Kamakoti","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"19","first-page":"345","article-title":"hierarchical dft with enhancements for ac scan, test scheduling and on-chip compression - a case study","author":"fisette","year":"2004","journal-title":"Proc Intl Test Conf"},{"key":"22","doi-asserted-by":"publisher","DOI":"10.1109\/VLSID.2007.76"},{"key":"17","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2005.270"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2005.1493988"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2004.842885"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1109\/ISVLSI.2005.53"},{"key":"13","doi-asserted-by":"crossref","first-page":"1142","DOI":"10.1109\/TCAD.2004.829797","article-title":"scan architecture with mutually exclusive scan segment activation for shift and capture-power reduction","author":"rosinger","year":"2004","journal-title":"IEEE Trans on Computer-Aided Design of Integrated Circuits and Systems"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1386971"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2006.126"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2002.1003802"},{"key":"21","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805650"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1386970"},{"key":"20","doi-asserted-by":"publisher","DOI":"10.1109\/VLSID.2007.136"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1271098"},{"journal-title":"International Technology Roadmap for Semiconductors","article-title":"design technology challenges","year":"2005","key":"1"},{"key":"10","doi-asserted-by":"crossref","DOI":"10.1109\/4.982424","article-title":"impact of die-to-die and within-die parameter fluctuations on maximum clock frequency distribution for giga-scale integration","author":"bowman","year":"2002","journal-title":"IEEE Journal of Solid State Circuits"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/4.604077"},{"key":"6","first-page":"125","article-title":"high-performance and low-power challenges for sub-70nm microprocessor circuits","author":"krishnamurthy","year":"2002","journal-title":"IEEE Custom Integrated Circuits Conference"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1270873"},{"key":"4","first-page":"58","article-title":"a new atpg method for efficient capture power reduction during scan testing","author":"wen","year":"2006","journal-title":"Proc VLSI Test Symp"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/4.997858"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/4.881202"}],"event":{"name":"2007 IEEE International Test Conference","start":{"date-parts":[[2007,10,21]]},"location":"Santa Clara, CA, USA","end":{"date-parts":[[2007,10,26]]}},"container-title":["2007 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4437545\/4437546\/04437598.pdf?arnumber=4437598","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,18]],"date-time":"2017-06-18T03:33:10Z","timestamp":1497756790000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4437598\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2007]]},"references-count":22,"URL":"https:\/\/doi.org\/10.1109\/test.2007.4437598","relation":{},"subject":[],"published":{"date-parts":[[2007]]}}}