{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,12]],"date-time":"2026-06-12T21:03:47Z","timestamp":1781298227982,"version":"3.54.1"},"reference-count":34,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2007]]},"DOI":"10.1109\/test.2007.4437603","type":"proceedings-article","created":{"date-parts":[[2008,1,29]],"date-time":"2008-01-29T15:41:30Z","timestamp":1201621290000},"page":"1-10","source":"Crossref","is-referenced-by-count":13,"title":["Testing for systematic defects based on DFM guidelines"],"prefix":"10.1109","author":[{"family":"Dongok Kim","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"M. Enamul","family":"Amyeen","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"family":"Srikanth Venkataraman","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Irith","family":"Pomeranz","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"family":"Swagato Basumallick","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Berni","family":"Landau","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"19","year":"0"},{"key":"17","doi-asserted-by":"publisher","DOI":"10.1109\/54.199804"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894237"},{"key":"33","first-page":"89","article-title":"comparison of ac self-testing procedures","author":"barzilai","year":"1983","journal-title":"Proc Int Test Conf"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1109\/43.700723"},{"key":"34","year":"0"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1995.529895"},{"key":"13","year":"0"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1988.207759"},{"key":"11","first-page":"771","article-title":"gate exhaustive testing","author":"cho","year":"2005","journal-title":"Proc Int Test Conf"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894271"},{"key":"21","year":"0"},{"key":"20","doi-asserted-by":"publisher","DOI":"10.1109\/43.238615"},{"key":"22","first-page":"342","article-title":"model for delay faults based on paths","author":"smith","year":"1985","journal-title":"Proc Int Test Conf"},{"key":"23","doi-asserted-by":"publisher","DOI":"10.1109\/ICM.2004.1434593"},{"key":"24","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2006.297716"},{"key":"25","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1996.510874"},{"key":"26","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1271071"},{"key":"27","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805769"},{"key":"28","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2005.852670"},{"key":"29","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966731"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1386954"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1386966"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2004.1299221"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1386963"},{"key":"30","year":"0"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/54.902820"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894222"},{"key":"32","doi-asserted-by":"publisher","DOI":"10.1145\/337292.337777"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1002\/0471653829"},{"key":"31","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.1981.1585380"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1387327"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1271073"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1271091"}],"event":{"name":"2007 IEEE International Test Conference","location":"Santa Clara, CA, USA","start":{"date-parts":[[2007,10,21]]},"end":{"date-parts":[[2007,10,26]]}},"container-title":["2007 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4437545\/4437546\/04437603.pdf?arnumber=4437603","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,6,12]],"date-time":"2026-06-12T20:53:53Z","timestamp":1781297633000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4437603\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2007]]},"references-count":34,"URL":"https:\/\/doi.org\/10.1109\/test.2007.4437603","relation":{},"subject":[],"published":{"date-parts":[[2007]]}}}