{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,4]],"date-time":"2025-11-04T10:15:36Z","timestamp":1762251336258},"reference-count":18,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2007]]},"DOI":"10.1109\/test.2007.4437604","type":"proceedings-article","created":{"date-parts":[[2008,1,29]],"date-time":"2008-01-29T15:41:30Z","timestamp":1201621290000},"page":"1-10","source":"Crossref","is-referenced-by-count":9,"title":["Faster defect localization in nanometer technology based on defective cell diagnosis"],"prefix":"10.1109","author":[{"family":"Manish Sharma","sequence":"first","affiliation":[]},{"family":"Wu-Tung Cheng","sequence":"additional","affiliation":[]},{"family":"Ting-Pu Tai","sequence":"additional","affiliation":[]},{"given":"Y.S.","family":"Cheng","sequence":"additional","affiliation":[]},{"family":"Will Hsu","sequence":"additional","affiliation":[]},{"family":"Chen Liu","sequence":"additional","affiliation":[]},{"given":"Sudhakar M.","family":"Reddy","sequence":"additional","affiliation":[]},{"given":"Albert","family":"Mann","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"17","DOI":"10.1109\/TCAD.2005.858267"},{"doi-asserted-by":"publisher","key":"18","DOI":"10.1109\/ATS.1997.643971"},{"key":"15","article-title":"compressed pattern diagnosis for scan chain failures","author":"huang","year":"2005","journal-title":"Proc Intl Test Conf"},{"key":"16","doi-asserted-by":"crossref","first-page":"1302","DOI":"10.1109\/DATE.2004.1269075","article-title":"scan chain diagnosis using iddq current measurement","author":"leininger","year":"2004","journal-title":"Proc of Design Automation and Test in Europe"},{"doi-asserted-by":"publisher","key":"13","DOI":"10.1109\/TEST.2002.1041767"},{"doi-asserted-by":"publisher","key":"14","DOI":"10.1109\/TCAD.2004.826558"},{"doi-asserted-by":"publisher","key":"11","DOI":"10.1109\/TEST.2006.297661"},{"key":"12","article-title":"a logic diagnosis methodology for improved localization and extraction of accurate defect behavior","author":"desineni","year":"2006","journal-title":"Proc Intl Test Conf"},{"doi-asserted-by":"publisher","key":"3","DOI":"10.1109\/TEST.2001.966644"},{"doi-asserted-by":"publisher","key":"2","DOI":"10.1109\/54.32421"},{"year":"1990","author":"abramovici","journal-title":"Digital Systems Testing and Testable Design","key":"1"},{"doi-asserted-by":"publisher","key":"10","DOI":"10.1109\/ATS.2006.260955"},{"key":"7","first-page":"253","article-title":"a novel stuck-at based method for transistor stuck-open fault diagnosis","author":"fan","year":"2005","journal-title":"Proc Intl Test Conf"},{"key":"6","article-title":"a gate-level method for transistor-level bridging fault diagnosis","author":"fan","year":"2006","journal-title":"Proc VLSI Test Symp"},{"key":"5","first-page":"181","article-title":"on methods to improve location based logic diagnosis","author":"zou","year":"2006","journal-title":"Proc VLSI Design"},{"doi-asserted-by":"publisher","key":"4","DOI":"10.1109\/TEST.2000.894213"},{"doi-asserted-by":"publisher","key":"9","DOI":"10.1109\/ICVD.2004.1260966"},{"doi-asserted-by":"publisher","key":"8","DOI":"10.1109\/TEST.2002.1041765"}],"event":{"name":"2007 IEEE International Test Conference","start":{"date-parts":[[2007,10,21]]},"location":"Santa Clara, CA, USA","end":{"date-parts":[[2007,10,26]]}},"container-title":["2007 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4437545\/4437546\/04437604.pdf?arnumber=4437604","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,17]],"date-time":"2017-06-17T23:33:10Z","timestamp":1497742390000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4437604\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2007]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/test.2007.4437604","relation":{},"subject":[],"published":{"date-parts":[[2007]]}}}