{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,3]],"date-time":"2024-09-03T17:20:26Z","timestamp":1725384026600},"reference-count":18,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2007]]},"DOI":"10.1109\/test.2007.4437609","type":"proceedings-article","created":{"date-parts":[[2008,1,29]],"date-time":"2008-01-29T15:41:30Z","timestamp":1201621290000},"page":"1-7","source":"Crossref","is-referenced-by-count":13,"title":["Fundamentals of timing information for test: How simple can we get?"],"prefix":"10.1109","author":[{"given":"Rohit","family":"Kapur","sequence":"first","affiliation":[]},{"given":"Jindrich","family":"Zejda","sequence":"additional","affiliation":[]},{"given":"T. W.","family":"Williams","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"17","first-page":"242","article-title":"evaluating the effectiveness of detecting delay defects in the slack interval: a simulation study","author":"yan","year":"2004","journal-title":"Proceedings of The International Test Conference"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2002.1167599"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.1985.1586020"},{"key":"16","article-title":"delay-fault testing mandatory, author claims","author":"wilson","year":"2002","journal-title":"EE Design"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1386956"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2000.838937"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1988.207761"},{"key":"12","first-page":"266","article-title":"taco: timing analysis with coupling","author":"pileggi","year":"2000","journal-title":"Proceedings of the Design Automation Conference"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1386990"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2006.297623"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2005.31"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1386957"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2003.1232252"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1386955"},{"article-title":"network timing analysis method which eliminates timing variations between signals traversing a common circuit path","year":"1997","author":"hathaway","key":"5"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/TCS.1979.1084687"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894237"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2006.261012"}],"event":{"name":"2007 IEEE International Test Conference","start":{"date-parts":[[2007,10,21]]},"location":"Santa Clara, CA, USA","end":{"date-parts":[[2007,10,26]]}},"container-title":["2007 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4437545\/4437546\/04437609.pdf?arnumber=4437609","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,16]],"date-time":"2017-03-16T18:53:51Z","timestamp":1489690431000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4437609\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2007]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/test.2007.4437609","relation":{},"subject":[],"published":{"date-parts":[[2007]]}}}