{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,12]],"date-time":"2026-06-12T21:03:28Z","timestamp":1781298208192,"version":"3.54.1"},"reference-count":22,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2007]]},"DOI":"10.1109\/test.2007.4437614","type":"proceedings-article","created":{"date-parts":[[2008,1,29]],"date-time":"2008-01-29T15:41:30Z","timestamp":1201621290000},"page":"1-10","source":"Crossref","is-referenced-by-count":9,"title":["Functional testing of digital microfluidic biochips"],"prefix":"10.1109","author":[{"family":"Tao Xu","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Krishnendu","family":"Chakrabarty","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"19","doi-asserted-by":"publisher","DOI":"10.1039\/b307628h"},{"key":"22","doi-asserted-by":"publisher","DOI":"10.1117\/12.580145"},{"key":"17","year":"0"},{"key":"18","article-title":"investigation of electrowetting-based microfluidics for real-time pcr applications","author":"pollack","year":"2003","journal-title":"International Conference on Micro Total Analysis Systems (uTAS)"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1016\/S0009-8981(02)00093-1"},{"key":"16","first-page":"487","article-title":"defect-oriented testing and diagnosis of digital microfluidics-based biochips","author":"su","year":"2005","journal-title":"Proc IEEE International Test Conference"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2005.848127"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1387352"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2007.28"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2003.1197681"},{"key":"21","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-006-0554-8"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1039\/b403082f"},{"key":"20","doi-asserted-by":"publisher","DOI":"10.1039\/b210825a"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2003.813570"},{"key":"1","year":"0"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2006.244039"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1271108"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/MEMSYS.2005.1454032"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1016\/S0958-1669(02)00004-6"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1126\/science.286.5441.942"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894270"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1145\/1065579.1065797"}],"event":{"name":"2007 IEEE International Test Conference","location":"Santa Clara, CA, USA","start":{"date-parts":[[2007,10,21]]},"end":{"date-parts":[[2007,10,26]]}},"container-title":["2007 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4437545\/4437546\/04437614.pdf?arnumber=4437614","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,6,12]],"date-time":"2026-06-12T20:53:52Z","timestamp":1781297632000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4437614\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2007]]},"references-count":22,"URL":"https:\/\/doi.org\/10.1109\/test.2007.4437614","relation":{},"subject":[],"published":{"date-parts":[[2007]]}}}