{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T12:24:22Z","timestamp":1725625462607},"reference-count":12,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2007]]},"DOI":"10.1109\/test.2007.4437623","type":"proceedings-article","created":{"date-parts":[[2008,1,29]],"date-time":"2008-01-29T15:41:30Z","timestamp":1201621290000},"page":"1-9","source":"Crossref","is-referenced-by-count":4,"title":["Co-development of test electronics and PCI Express interface for a multi-Gbps optical switching network"],"prefix":"10.1109","author":[{"given":"C.E.","family":"Gray","sequence":"first","affiliation":[]},{"given":"O. Liboiron-","family":"Ladouceur","sequence":"additional","affiliation":[]},{"given":"D.C.","family":"Keezer","sequence":"additional","affiliation":[]},{"given":"K.","family":"Bergman","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/JLT.2005.856242"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/JLT.2006.879508"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/JLT.2003.808766"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/ICPP.1997.622680"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041793"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/LPT.2005.860396"},{"key":"5","article-title":"multi-gigahertz source synchronous testing of an optical packet switching network","author":"gray","year":"2006","journal-title":"International Mixed-Signals Test Workshop"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2005.203"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/EPTC.2005.1614511"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1270837"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/LPT.2006.871651"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/EPTC.2006.342745"}],"event":{"name":"2007 IEEE International Test Conference","start":{"date-parts":[[2007,10,21]]},"location":"Santa Clara, CA, USA","end":{"date-parts":[[2007,10,26]]}},"container-title":["2007 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4437545\/4437546\/04437623.pdf?arnumber=4437623","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,16]],"date-time":"2017-03-16T17:22:04Z","timestamp":1489684924000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4437623\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2007]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/test.2007.4437623","relation":{},"subject":[],"published":{"date-parts":[[2007]]}}}