{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T15:12:39Z","timestamp":1730301159086,"version":"3.28.0"},"reference-count":14,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2007]]},"DOI":"10.1109\/test.2007.4437625","type":"proceedings-article","created":{"date-parts":[[2008,1,29]],"date-time":"2008-01-29T15:41:30Z","timestamp":1201621290000},"page":"1-9","source":"Crossref","is-referenced-by-count":2,"title":["IEEE P1581 can solve your board level memory cluster test problems"],"prefix":"10.1109","author":[{"given":"Heiko","family":"Ehrenberg","sequence":"first","affiliation":[]}],"member":"263","reference":[{"journal-title":"Xilinx Product Specification for Platform FLASH DS123 pdf","year":"0","key":"13"},{"volume":"1532","journal-title":"IEEE Standard for InSystem Configuration of Programmable Devices IEEE Std","year":"2002","key":"14"},{"journal-title":"Lattice data sheet and BSDL files for ispCLOCK 5600A Family","year":"0","key":"11"},{"journal-title":"Infineon data sheet for 512-Mbit GDDR3 Graphics RAMHYB18H512321AF","year":"0","key":"12"},{"year":"0","key":"3"},{"year":"0","key":"2"},{"year":"0","key":"1"},{"key":"10","article-title":"leveraging boundary scan resources for comprehensive cluster testing","author":"ehrenberg","year":"2004","journal-title":"Board Test Workshop"},{"journal-title":"IDT data sheet and BSDL file for High-Density Supersync II? Narrow Bus FIFO IDT72V2113","year":"0","key":"7"},{"journal-title":"Cypress data sheet and BSDL file for Synchronous Pipelined NoBL SRAM CY7C1354CV25","year":"0","key":"6"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1271204"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1386948"},{"year":"0","key":"9"},{"journal-title":"MICRON data sheet and BSDL file for RLDRAM II MT49H8M36","year":"0","key":"8"}],"event":{"name":"2007 IEEE International Test Conference","start":{"date-parts":[[2007,10,21]]},"location":"Santa Clara, CA, USA","end":{"date-parts":[[2007,10,26]]}},"container-title":["2007 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4437545\/4437546\/04437625.pdf?arnumber=4437625","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,16]],"date-time":"2017-03-16T17:19:17Z","timestamp":1489684757000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4437625\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2007]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/test.2007.4437625","relation":{},"subject":[],"published":{"date-parts":[[2007]]}}}