{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T15:12:40Z","timestamp":1730301160178,"version":"3.28.0"},"reference-count":19,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2007]]},"DOI":"10.1109\/test.2007.4437626","type":"proceedings-article","created":{"date-parts":[[2008,1,29]],"date-time":"2008-01-29T20:41:30Z","timestamp":1201639290000},"page":"1-10","source":"Crossref","is-referenced-by-count":20,"title":["Statistical analysis and optimization of parametric delay test"],"prefix":"10.1109","author":[{"given":"Sean H.","family":"Wu","sequence":"first","affiliation":[]},{"given":"Benjamin N.","family":"Lee","sequence":"additional","affiliation":[]},{"given":"Li-C.","family":"Wang","sequence":"additional","affiliation":[]},{"given":"Magdy S.","family":"Abadir","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"journal-title":"Benjamin N Lee libRF A library for Random Forests","year":"2007","key":"19"},{"year":"0","key":"17"},{"year":"0","key":"18"},{"year":"0","key":"15"},{"year":"0","key":"16"},{"year":"0","key":"13"},{"journal-title":"Issues on Test Optimization with Known Good Dies and Known Defective Dies - A Statistical Perspective","year":"2006","author":"lee","key":"14"},{"key":"11","article-title":"pattern selection for testing of deep sub-micron timing defects","author":"chao","year":"2004","journal-title":"DATE"},{"year":"0","key":"12"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1145\/1143844.1143865"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1023\/A:1010933404324"},{"key":"1","article-title":"class probability estimation and cost-sensitive classification decisions","author":"margineantu","year":"2002","journal-title":"European Conference on Machine Learning"},{"year":"0","key":"10"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/54.902820"},{"year":"0","key":"6"},{"year":"0","key":"5"},{"year":"0","key":"4"},{"year":"0","key":"9"},{"key":"8","first-page":"325","article-title":"advancements and applications of statistical learning\/data mining in semiconductor manufacturing","volume":"8","author":"goodwin","year":"2004","journal-title":"Intel Technology Journal"}],"event":{"name":"2007 IEEE International Test Conference","start":{"date-parts":[[2007,10,21]]},"location":"Santa Clara, CA, USA","end":{"date-parts":[[2007,10,26]]}},"container-title":["2007 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4437545\/4437546\/04437626.pdf?arnumber=4437626","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,16]],"date-time":"2017-03-16T21:19:17Z","timestamp":1489699157000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4437626\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2007]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/test.2007.4437626","relation":{},"subject":[],"published":{"date-parts":[[2007]]}}}