{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,7,26]],"date-time":"2025-07-26T09:19:03Z","timestamp":1753521543587},"reference-count":12,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2007]]},"DOI":"10.1109\/test.2007.4437627","type":"proceedings-article","created":{"date-parts":[[2008,1,29]],"date-time":"2008-01-29T20:41:30Z","timestamp":1201639290000},"page":"1-9","source":"Crossref","is-referenced-by-count":10,"title":["Backside E-Beam Probing on Nano scale devices"],"prefix":"10.1109","author":[{"given":"R.","family":"Schalangen","sequence":"first","affiliation":[]},{"given":"R.","family":"Leihkauf","sequence":"additional","affiliation":[]},{"given":"U.","family":"Kerst","sequence":"additional","affiliation":[]},{"given":"C.","family":"Boit","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"year":"0","author":"shaw","key":"3"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1998.743255"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/16.658677"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/54.32411"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2005.1584092"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/IPFA.2007.4378053"},{"key":"5","first-page":"79","article-title":"advanced fringe analysis techniques in circuit edit","author":"jain","year":"2006","journal-title":"Proc ISTFA"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2005.07.033"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.1995.499297"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.2007.369946"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2006.876292"},{"year":"0","key":"12"}],"event":{"name":"2007 IEEE International Test Conference","start":{"date-parts":[[2007,10,21]]},"location":"Santa Clara, CA, USA","end":{"date-parts":[[2007,10,26]]}},"container-title":["2007 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4437545\/4437546\/04437627.pdf?arnumber=4437627","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,16]],"date-time":"2017-03-16T21:19:18Z","timestamp":1489699158000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4437627\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2007]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/test.2007.4437627","relation":{},"subject":[],"published":{"date-parts":[[2007]]}}}