{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T15:12:42Z","timestamp":1730301162828,"version":"3.28.0"},"reference-count":17,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2007]]},"DOI":"10.1109\/test.2007.4437643","type":"proceedings-article","created":{"date-parts":[[2008,1,29]],"date-time":"2008-01-29T20:41:30Z","timestamp":1201639290000},"page":"1-10","source":"Crossref","is-referenced-by-count":0,"title":["Test yield estimation for analog\/RF circuits over multiple correlated measurements"],"prefix":"10.1109","author":[{"family":"Fang Liu","sequence":"first","affiliation":[]},{"given":"Erkan","family":"Acar","sequence":"additional","affiliation":[]},{"given":"Sule","family":"Ozev","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"17","DOI":"10.1080\/10618600.1992.10477010"},{"key":"15","first-page":"3266","article-title":"cmos analog circuit design via geometric programming","volume":"4","author":"del mar hershenson","year":"2004","journal-title":"IEEE American Control Conference"},{"year":"1975","author":"chua","journal-title":"Computer-aided analysis of electronic circuits Algorithms and computational methods","key":"16"},{"key":"13","first-page":"855","article-title":"robust analog\/rf circuit design with projection-based posynomial modeling","author":"li","year":"2004","journal-title":"IEEE International Conference on Computer Aided Design"},{"key":"14","first-page":"296","article-title":"gpcad: a tool for cmos op-amp synthesis","author":"del mar hershenson","year":"1998","journal-title":"IEEE International Conference on Computer-Aided Design"},{"doi-asserted-by":"publisher","key":"11","DOI":"10.1145\/1065579.1065662"},{"doi-asserted-by":"publisher","key":"12","DOI":"10.1109\/ICCAD.2004.1382533"},{"doi-asserted-by":"publisher","key":"3","DOI":"10.1109\/VTS.2006.30"},{"doi-asserted-by":"publisher","key":"2","DOI":"10.1109\/VTEST.1999.766670"},{"year":"0","key":"1"},{"doi-asserted-by":"publisher","key":"10","DOI":"10.1109\/DAC.2002.1012664"},{"doi-asserted-by":"publisher","key":"7","DOI":"10.1109\/43.992763"},{"doi-asserted-by":"publisher","key":"6","DOI":"10.2307\/1269802"},{"doi-asserted-by":"publisher","key":"5","DOI":"10.1080\/00207547808930043"},{"doi-asserted-by":"publisher","key":"4","DOI":"10.1287\/opre.11.5.839"},{"doi-asserted-by":"publisher","key":"9","DOI":"10.1109\/DATE.2006.244136"},{"doi-asserted-by":"publisher","key":"8","DOI":"10.1109\/DATE.2005.89"}],"event":{"name":"2007 IEEE International Test Conference","start":{"date-parts":[[2007,10,21]]},"location":"Santa Clara, CA, USA","end":{"date-parts":[[2007,10,26]]}},"container-title":["2007 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4437545\/4437546\/04437643.pdf?arnumber=4437643","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,16]],"date-time":"2017-03-16T21:28:47Z","timestamp":1489699727000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4437643\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2007]]},"references-count":17,"URL":"https:\/\/doi.org\/10.1109\/test.2007.4437643","relation":{},"subject":[],"published":{"date-parts":[[2007]]}}}