{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,12]],"date-time":"2026-06-12T21:03:32Z","timestamp":1781298212945,"version":"3.54.1"},"reference-count":20,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2007]]},"DOI":"10.1109\/test.2007.4437649","type":"proceedings-article","created":{"date-parts":[[2008,1,29]],"date-time":"2008-01-29T15:41:30Z","timestamp":1201621290000},"page":"1-10","source":"Crossref","is-referenced-by-count":50,"title":["Embedded multi-detect ATPG and Its Effect on the Detection of Unmodeled Defects"],"prefix":"10.1109","author":[{"given":"Jeroen","family":"Geuzebroek","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Erik Jan","family":"Marinissen","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Ananta","family":"Majhi","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Andreas","family":"Glowatz","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Friedrich","family":"Hapke","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"19","year":"0"},{"key":"17","doi-asserted-by":"publisher","DOI":"10.1145\/1146909.1147186"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1995.529894"},{"key":"15","first-page":"94","article-title":"a new atpg algorithm to limit test set size and achieve multiple detections of all faults","author":"lee","year":"2002","journal-title":"Proceedings of the Design Automation and Test in Europe (DATE)"},{"key":"16","year":"0"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2005.110"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2004.1299220"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1999.766675"},{"key":"12","year":"0"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2004.1299221"},{"key":"20","first-page":"194","article-title":"compactest: a method to generate compact test sets for combinational circuits","author":"irith pomeranz","year":"1991","journal-title":"Proceedings IEEE International Test Conference (ITC)"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1995.529895"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2007.20"},{"key":"10","year":"0"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1387328"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894222"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1998.743151"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2001.915070"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1271091"},{"key":"8","year":"0"}],"event":{"name":"2007 IEEE International Test Conference","location":"Santa Clara, CA, USA","start":{"date-parts":[[2007,10,21]]},"end":{"date-parts":[[2007,10,26]]}},"container-title":["2007 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4437545\/4437546\/04437649.pdf?arnumber=4437649","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,6,12]],"date-time":"2026-06-12T20:53:53Z","timestamp":1781297633000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4437649\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2007]]},"references-count":20,"URL":"https:\/\/doi.org\/10.1109\/test.2007.4437649","relation":{},"subject":[],"published":{"date-parts":[[2007]]}}}