{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,11]],"date-time":"2025-06-11T05:43:01Z","timestamp":1749620581830},"reference-count":12,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2007]]},"DOI":"10.1109\/test.2007.4437651","type":"proceedings-article","created":{"date-parts":[[2008,1,29]],"date-time":"2008-01-29T15:41:30Z","timestamp":1201621290000},"page":"1-9","source":"Crossref","is-referenced-by-count":12,"title":["Enhanced testing of clock faults"],"prefix":"10.1109","author":[{"given":"Teresa L.","family":"McLaurin","sequence":"first","affiliation":[]},{"given":"Richard","family":"Slobodnik","sequence":"additional","affiliation":[]},{"family":"Kun-Han Tsai","sequence":"additional","affiliation":[]},{"given":"Ana","family":"Keim","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1270907"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.1998.669476"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2006.229279"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2006.297638"},{"key":"7","first-page":"342","article-title":"model for delay faults based upon paths, in proc","author":"smith","year":"1985","journal-title":"International Test Conference"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/43.238615"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2000.839704"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2003.1232252"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894220"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2006.261012"},{"year":"0","key":"11"},{"year":"0","key":"12"}],"event":{"name":"2007 IEEE International Test Conference","start":{"date-parts":[[2007,10,21]]},"location":"Santa Clara, CA, USA","end":{"date-parts":[[2007,10,26]]}},"container-title":["2007 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4437545\/4437546\/04437651.pdf?arnumber=4437651","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,16]],"date-time":"2017-03-16T17:22:36Z","timestamp":1489684956000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4437651\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2007]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/test.2007.4437651","relation":{},"subject":[],"published":{"date-parts":[[2007]]}}}