{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,12]],"date-time":"2026-06-12T21:05:06Z","timestamp":1781298306145,"version":"3.54.1"},"reference-count":9,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2007]]},"DOI":"10.1109\/test.2007.4437655","type":"proceedings-article","created":{"date-parts":[[2008,1,29]],"date-time":"2008-01-29T15:41:30Z","timestamp":1201621290000},"page":"1-10","source":"Crossref","is-referenced-by-count":10,"title":["A fully digital-compatible BIST strategy for ADC linearity testing"],"prefix":"10.1109","author":[{"family":"Hanqing Xing","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"family":"Hanjun Jiang","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"family":"Degang Chen","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Randall","family":"Geiger","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1989.82284"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2005.1584003"},{"key":"1","year":"0"},{"key":"7","author":"burns","year":"2000","journal-title":"An Introduction to Mixed-Signal IC Test and Measurement"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.903621"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2002.807415"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/19.293454"},{"key":"9","article-title":"a low-cost on-chip stimulus source with 16-bit equivalent linearity for adc built-in self-test","author":"jiang","year":"2005","journal-title":"TechCon"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2005.847240"}],"event":{"name":"2007 IEEE International Test Conference","location":"Santa Clara, CA, USA","start":{"date-parts":[[2007,10,21]]},"end":{"date-parts":[[2007,10,26]]}},"container-title":["2007 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4437545\/4437546\/04437655.pdf?arnumber=4437655","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,6,12]],"date-time":"2026-06-12T20:53:53Z","timestamp":1781297633000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4437655\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2007]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/test.2007.4437655","relation":{},"subject":[],"published":{"date-parts":[[2007]]}}}