{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,3]],"date-time":"2024-09-03T20:11:13Z","timestamp":1725394273458},"reference-count":0,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2007]]},"DOI":"10.1109\/test.2007.4437698","type":"proceedings-article","created":{"date-parts":[[2008,1,29]],"date-time":"2008-01-29T20:41:30Z","timestamp":1201639290000},"page":"1-1","source":"Crossref","is-referenced-by-count":2,"title":["Car IC test changing but the same quality goal"],"prefix":"10.1109","author":[{"given":"Gary","family":"Wittie","sequence":"first","affiliation":[]}],"member":"263","event":{"name":"2007 IEEE International Test Conference","start":{"date-parts":[[2007,10,21]]},"location":"Santa Clara, CA, USA","end":{"date-parts":[[2007,10,26]]}},"container-title":["2007 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4437545\/4437546\/04437698.pdf?arnumber=4437698","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,16]],"date-time":"2017-03-16T21:22:09Z","timestamp":1489699329000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4437698\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2007]]},"references-count":0,"URL":"https:\/\/doi.org\/10.1109\/test.2007.4437698","relation":{},"subject":[],"published":{"date-parts":[[2007]]}}}