{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,12]],"date-time":"2026-06-12T21:05:06Z","timestamp":1781298306116,"version":"3.54.1"},"reference-count":16,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2007]]},"DOI":"10.1109\/test.2007.4437700","type":"proceedings-article","created":{"date-parts":[[2008,1,29]],"date-time":"2008-01-29T15:41:30Z","timestamp":1201621290000},"page":"1-10","source":"Crossref","is-referenced-by-count":16,"title":["Statistical test: A new paradigm to improve test effectiveness & efficiency"],"prefix":"10.1109","author":[{"given":"Peter M.","family":"O'Neill","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"15","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1386951"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1109\/AUTEST.2005.1609118"},{"key":"13","author":"kantardzic","year":"2002","journal-title":"Data Mining Concepts Models Methods and Algorithms"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2002.1011113"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/ASMC.1990.111228"},{"key":"12","first-page":"407","article-title":"a self-clustering algorithm for establishing statistical bin limits using multi-dimensional data","author":"lund","year":"2001","journal-title":"Proceedings of the 27th International Symposium for Testing & Failure Analysis"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041820"},{"key":"2","article-title":"guidelines for part average testing","year":"2003","journal-title":"AEC-Q001-Rev-C"},{"key":"1","article-title":"reduced pin-count multi-site test with i\/o bandwidth matching for wafer test - why and how?","author":"rivoir","year":"2001","journal-title":"Proceedings of the 2nd IEEE Workshop on Test Resource Partitioning"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966738"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1016\/S0893-6080(00)00026-5"},{"key":"6","doi-asserted-by":"crossref","first-page":"427","DOI":"10.1109\/VTS.2005.38","article-title":"defect screening using independent component analysis on iddq","author":"turakhia","year":"2005","journal-title":"Proc 22nd VLSI Test Symp"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2006.90"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805803"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2001.923457"},{"key":"8","first-page":"1240","article-title":"neighbor selection for variance reduction in iddq and other parametric data","author":"daasch","year":"2001","journal-title":"Proceedings of The International Test Conference"}],"event":{"name":"2007 IEEE International Test Conference","location":"Santa Clara, CA, USA","start":{"date-parts":[[2007,10,21]]},"end":{"date-parts":[[2007,10,26]]}},"container-title":["2007 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4437545\/4437546\/04437700.pdf?arnumber=4437700","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,6,12]],"date-time":"2026-06-12T20:53:53Z","timestamp":1781297633000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4437700\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2007]]},"references-count":16,"URL":"https:\/\/doi.org\/10.1109\/test.2007.4437700","relation":{},"subject":[],"published":{"date-parts":[[2007]]}}}