{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T12:25:17Z","timestamp":1725625517447},"reference-count":7,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2008,10]]},"DOI":"10.1109\/test.2008.4700558","type":"proceedings-article","created":{"date-parts":[[2008,12,10]],"date-time":"2008-12-10T12:55:58Z","timestamp":1228913758000},"page":"1-8","source":"Crossref","is-referenced-by-count":12,"title":["Low cost testing of multi-GBit device pins with ATE assisted loopback instrument"],"prefix":"10.1109","author":[{"given":"W.A.","family":"Fritzsche","sequence":"first","affiliation":[]},{"given":"A.E.","family":"Haque","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2005.1584028"},{"key":"2","article-title":"multi-ghz loopback testing usingv mems switches and sige logic","author":"keezer","year":"2007","journal-title":"ITC"},{"year":"2007","author":"sunter","key":"1"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1990.114042"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041930"},{"journal-title":"Vectorless Test Best Bet for High-Speed I\/O","year":"0","author":"laquai","key":"5"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2005.1584051"}],"event":{"name":"2008 IEEE International Test Conference","start":{"date-parts":[[2008,10,28]]},"location":"Santa Clara, CA","end":{"date-parts":[[2008,10,30]]}},"container-title":["2008 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4690905\/4700527\/04700558.pdf?arnumber=4700558","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,17]],"date-time":"2017-03-17T11:53:23Z","timestamp":1489751603000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4700558\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,10]]},"references-count":7,"URL":"https:\/\/doi.org\/10.1109\/test.2008.4700558","relation":{},"subject":[],"published":{"date-parts":[[2008,10]]}}}