{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T03:51:59Z","timestamp":1725421919057},"reference-count":28,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2008,10]]},"DOI":"10.1109\/test.2008.4700563","type":"proceedings-article","created":{"date-parts":[[2008,12,10]],"date-time":"2008-12-10T12:55:58Z","timestamp":1228913758000},"page":"1-8","source":"Crossref","is-referenced-by-count":10,"title":["Scan Based Testing of Dual\/Multi Core Processors for Small Delay Defects"],"prefix":"10.1109","author":[{"given":"A.D.","family":"Singh","sequence":"first","affiliation":[]}],"member":"263","reference":[{"key":"19","first-page":"1098","author":"saxena","year":"2003","journal-title":"Proceedings International Test Conference"},{"key":"17","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2003.1232253"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041869"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2003.1232252"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2004.17"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1386955"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.1987.1270315"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2003.1232251"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805629"},{"key":"21","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2006.53"},{"key":"20","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2005.1583964"},{"key":"22","first-page":"342","article-title":"model for delay faults based upon paths","author":"smith","year":"1985","journal-title":"Proceedings International Test Conference"},{"key":"23","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2004.1269036"},{"key":"24","first-page":"1","article-title":"power supply noise in delay testing","author":"wang","year":"2006","journal-title":"Proc International Test Conference"},{"key":"25","first-page":"9","article-title":"low cost launch-on-shift delay test with slow scan enable","author":"xu","year":"2006","journal-title":"Proc Eur Test Symp"},{"key":"26","doi-asserted-by":"publisher","DOI":"10.1109\/VLSID.2007.61"},{"key":"27","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2006.886415"},{"key":"28","article-title":"evaluating the effectiveness of detecting delay defects in the slack interval: a simulation study","author":"yan","year":"2004","journal-title":"Proceedings International Test Conference"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2005.31"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2003.159687"},{"key":"10","article-title":"scanbased transition test can do job","author":"jayram","year":"2003","journal-title":"EE Times"},{"key":"1","first-page":"123","article-title":"non-robust versus robust","author":"ierzynska","year":"1995","journal-title":"Proceedings International Test Conference"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2005.87"},{"key":"6","article-title":"essentials of electronic testing for digital, memory and mixed-signal vlsi circuits","author":"bushnell","year":"2000","journal-title":"Springer"},{"key":"5","first-page":"8","article-title":"delay testing for nanometer chips","author":"barnhart","year":"2004","journal-title":"Chip Design"},{"key":"4","article-title":"beyond at-speed","author":"amodeo","year":"2005","journal-title":"Test & Measurement World"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2005.1583983"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2003.1232254"}],"event":{"name":"2008 IEEE International Test Conference","start":{"date-parts":[[2008,10,28]]},"location":"Santa Clara, CA","end":{"date-parts":[[2008,10,30]]}},"container-title":["2008 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4690905\/4700527\/04700563.pdf?arnumber=4700563","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,17]],"date-time":"2017-03-17T14:01:16Z","timestamp":1489759276000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4700563\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,10]]},"references-count":28,"URL":"https:\/\/doi.org\/10.1109\/test.2008.4700563","relation":{},"subject":[],"published":{"date-parts":[[2008,10]]}}}