{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,25]],"date-time":"2026-02-25T18:09:13Z","timestamp":1772042953866,"version":"3.50.1"},"reference-count":28,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2008,10]]},"DOI":"10.1109\/test.2008.4700566","type":"proceedings-article","created":{"date-parts":[[2008,12,10]],"date-time":"2008-12-10T12:55:58Z","timestamp":1228913758000},"page":"1-10","source":"Crossref","is-referenced-by-count":5,"title":["CONCAT: CONflict Driven Learning in ATPG for Industrial designs"],"prefix":"10.1109","author":[{"given":"S.","family":"Bommu","sequence":"first","affiliation":[]},{"given":"K.","family":"Chandrasekar","sequence":"additional","affiliation":[]},{"given":"R.","family":"Kundu","sequence":"additional","affiliation":[]},{"given":"S.","family":"Sengupta","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"19","first-page":"87","article-title":"conflict driven techniques for improving deterministic test pattern generation","author":"wang","year":"2002","journal-title":"Proc Conf Computer-Aided Design"},{"key":"17","first-page":"147","article-title":"techniques for improving the efficiency of sequential test generation","author":"lin","year":"1999","journal-title":"Proceedings of ICCAD"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1109\/43.275361"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.1990.114937"},{"key":"16","doi-asserted-by":"crossref","first-page":"705","DOI":"10.1145\/196244.196621","article-title":"dynamic search-space pruning techniques in path sensitization","author":"marques silva","year":"1994","journal-title":"31st Design Automation Conference"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1998.670910"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/43.310903"},{"key":"11","doi-asserted-by":"crossref","first-page":"152","DOI":"10.1109\/43.822627","article-title":"tair: testability analysis by implication reasoning","volume":"19","author":"chang","year":"2000","journal-title":"IEEE Trans on CAD"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/43.3140"},{"key":"21","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1996.569607"},{"key":"20","doi-asserted-by":"publisher","DOI":"10.1109\/43.108614"},{"key":"22","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2001.156196"},{"key":"23","doi-asserted-by":"publisher","DOI":"10.1109\/43.238038"},{"key":"24","doi-asserted-by":"publisher","DOI":"10.1109\/43.536723"},{"key":"25","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2002.804387"},{"key":"26","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2005.55"},{"key":"27","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2002.1012722"},{"key":"28","first-page":"279","article-title":"efficient conflict driven learning in a boolean satisfiability solver","author":"zhang","year":"2001","journal-title":"Proceedings of IEEE International Conference on Computer Aided Design"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1976.1674663"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1147\/rd.104.0278"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/12.54854"},{"key":"1","article-title":"concat: an efficient atpg engine with conflict learning","author":"bommu","year":"2006","journal-title":"Intel Invention Disclosure"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/9780470544389"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.1988.14741"},{"key":"5","first-page":"671","article-title":"fan: a fanout-oriented test pattern generation algorithm","author":"fujiwara","year":"1985","journal-title":"Proc Of ISCAS"},{"key":"4","first-page":"145","article-title":"an implicit enumeration algorithm to generate tests for combinational logic circuits","author":"goel","year":"1980","journal-title":"Proc IEEE Fault-Tolerant Computing Symp"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/TCS.1979.1084687"},{"key":"8","first-page":"221","article-title":"on testability of combinational networks","author":"breglez","year":"1984","journal-title":"Proceedings IEEE ISCAS"}],"event":{"name":"2008 IEEE International Test Conference","location":"Santa Clara, CA","start":{"date-parts":[[2008,10,28]]},"end":{"date-parts":[[2008,10,30]]}},"container-title":["2008 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4690905\/4700527\/04700566.pdf?arnumber=4700566","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,18]],"date-time":"2017-06-18T10:37:30Z","timestamp":1497782250000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4700566\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,10]]},"references-count":28,"URL":"https:\/\/doi.org\/10.1109\/test.2008.4700566","relation":{},"subject":[],"published":{"date-parts":[[2008,10]]}}}