{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T21:26:41Z","timestamp":1725485201698},"reference-count":18,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2008,10]]},"DOI":"10.1109\/test.2008.4700567","type":"proceedings-article","created":{"date-parts":[[2008,12,10]],"date-time":"2008-12-10T12:55:58Z","timestamp":1228913758000},"page":"1-10","source":"Crossref","is-referenced-by-count":0,"title":["SAT-based State Justification with Adaptive Mining of Invariants"],"prefix":"10.1109","author":[{"family":"Weixin Wu","sequence":"first","affiliation":[]},{"given":"M.S.","family":"Hsiao","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"17","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2006.229206"},{"journal-title":"Picojava technology","year":"0","key":"18"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1109\/12.859539"},{"key":"16","first-page":"432","article-title":"an efficient algorithm for mining association rules in large data bases","author":"savasere","year":"1995","journal-title":"Proc IEEE 5th Int Conf Very Large Data Bases"},{"key":"13","first-page":"307","article-title":"fast discovery of association rules","author":"agrawal","year":"1996","journal-title":"Advances in Knowledge Discovery and Data Mining"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/43.851997"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1147\/rd.104.0278"},{"journal-title":"Principles of Data Mining","year":"2001","author":"hand","key":"12"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/43.536723"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1983.1676174"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1981.1675757"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1145\/1146909.1147098"},{"key":"7","article-title":"minisat - a sat solver with conflict-clause minimization","author":"een","year":"2005","journal-title":"Proc Int'l Conf Theory and Applications of Satisfiability Testing (SAT)"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2003.1253719"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2001.156196"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1999.810638"},{"key":"9","first-page":"1108","article-title":"considering circuit observability don't cares in cnf satisfiability","author":"fu","year":"2005","journal-title":"Proc Design Aut and Test in Europe Conf"},{"key":"8","first-page":"970","article-title":"experimental studies on sat-based test pattern generation for industrial circuits","author":"shi","year":"2005","journal-title":"Proc Int Conf ASIC"}],"event":{"name":"2008 IEEE International Test Conference","start":{"date-parts":[[2008,10,28]]},"location":"Santa Clara, CA","end":{"date-parts":[[2008,10,30]]}},"container-title":["2008 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4690905\/4700527\/04700567.pdf?arnumber=4700567","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,17]],"date-time":"2017-03-17T13:58:04Z","timestamp":1489759084000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4700567\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,10]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/test.2008.4700567","relation":{},"subject":[],"published":{"date-parts":[[2008,10]]}}}