{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T07:17:27Z","timestamp":1729667847123,"version":"3.28.0"},"reference-count":30,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2008,10]]},"DOI":"10.1109\/test.2008.4700582","type":"proceedings-article","created":{"date-parts":[[2008,12,10]],"date-time":"2008-12-10T12:55:58Z","timestamp":1228913758000},"page":"1-10","source":"Crossref","is-referenced-by-count":4,"title":["On-line Failure Detection in Memory Order Buffers"],"prefix":"10.1109","author":[{"given":"J.","family":"Carretero","sequence":"first","affiliation":[]},{"given":"X.","family":"Vera","sequence":"additional","affiliation":[]},{"given":"P.","family":"Chaparro","sequence":"additional","affiliation":[]},{"given":"J.","family":"Abella","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"19","doi-asserted-by":"publisher","DOI":"10.1109\/ISCA.2002.1003566"},{"key":"17","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.1999.809458"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1109\/FTCS.1999.781037"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2001.922797"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1109\/TDSC.2004.4"},{"key":"13","doi-asserted-by":"crossref","DOI":"10.1145\/342001.339652","article-title":"transient fault detection via simultaneous multithreading","author":"reinhardt","year":"2000","journal-title":"Proceedings of the International Symposium on Computer Architecture (ISCA)"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1386935"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2005.54"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/FTCS.1999.781037"},{"key":"21","article-title":"detecting emerging wearout faults","author":"smolens","year":"2007","journal-title":"Proceedings of the 3rd Workshop on Silicon Errors in Logic - System Effects (SELSE07)"},{"key":"20","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041810"},{"key":"22","first-page":"97","article-title":"softwarebased online detection of hardware defects mechanisms, architectural support, and evaluation","volume":"200","author":"constantinides","year":"0","journal-title":"Proceedings of the 40th International Symposium on Microarchitecture (MICRO-40) pages"},{"key":"23","doi-asserted-by":"publisher","DOI":"10.1145\/1168857.1168868"},{"key":"24","doi-asserted-by":"publisher","DOI":"10.1109\/12.509907"},{"key":"25","doi-asserted-by":"publisher","DOI":"10.1109\/2.546611"},{"journal-title":"Technical Report 800-199-212 Version 8 Sun Microsystems Inc","article-title":"the sparc architecture manual","year":"1991","key":"26"},{"journal-title":"Intel\ufffd 64 architecture memory ordering white paper","year":"2007","key":"27"},{"key":"28","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2006.885041"},{"journal-title":"HP Technical Report HPL-2006-86","year":"2006","author":"tarjan","key":"29"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1387329"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2002.1028924"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2003.1253245"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2005.69"},{"key":"30","doi-asserted-by":"publisher","DOI":"10.1145\/263580.263599"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/2.803640"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/MTDT.1996.782492"},{"key":"5","doi-asserted-by":"crossref","first-page":"20","DOI":"10.1109\/DFTVS.2004.1347821","article-title":"failure factor based yield enhancement for sram designs","author":"hsing","year":"2004","journal-title":"Proc International Symposium on Defect and Fault Tolerance in VLSI Systems"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2003.816418"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2003.1253244"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/54.990438"}],"event":{"name":"2008 IEEE International Test Conference","start":{"date-parts":[[2008,10,28]]},"location":"Santa Clara, CA","end":{"date-parts":[[2008,10,30]]}},"container-title":["2008 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4690905\/4700527\/04700582.pdf?arnumber=4700582","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,18]],"date-time":"2017-06-18T10:37:29Z","timestamp":1497782249000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4700582\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,10]]},"references-count":30,"URL":"https:\/\/doi.org\/10.1109\/test.2008.4700582","relation":{},"subject":[],"published":{"date-parts":[[2008,10]]}}}