{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T14:30:45Z","timestamp":1725633045725},"reference-count":21,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2008,10]]},"DOI":"10.1109\/test.2008.4700587","type":"proceedings-article","created":{"date-parts":[[2008,12,10]],"date-time":"2008-12-10T17:55:58Z","timestamp":1228931758000},"page":"1-10","source":"Crossref","is-referenced-by-count":2,"title":["Deterministic Diagnostic Pattern Generation (DDPG) for Compound Defects"],"prefix":"10.1109","author":[{"given":"Fei","family":"Wang","sequence":"first","affiliation":[]},{"given":"Hu","family":"Yu","sequence":"additional","affiliation":[]},{"given":"Huawei","family":"Li","sequence":"additional","affiliation":[]},{"given":"Xiaowei","family":"Li","sequence":"additional","affiliation":[]},{"given":"Jing","family":"Ye","sequence":"additional","affiliation":[]},{"given":"Huang","family":"Yu","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"journal-title":"Digital Signal Processing Principles Algorithms and Applications","year":"1996","author":"proakis","key":"19"},{"key":"17","doi-asserted-by":"publisher","DOI":"10.1109\/DFTVS.1998.732169"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1997.639683"},{"key":"15","first-page":"291","article-title":"diagnosing dacs (defects that affect scan chain and system logic)","author":"huang","year":"2004","journal-title":"Proc Int'l Symp for Testing and Failure Analysis"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1995.512645"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2007.364645"},{"key":"14","article-title":"diagnose compound scan chain and system logic defects","author":"huang","year":"2007","journal-title":"Proc Int'l Test Conf"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2005.858267"},{"key":"12","article-title":"a method for isolating defects in scannable sequential elements","author":"cheney","year":"2000","journal-title":"Intel Hillsboro OR Intel Design Test Technol Conf Rep"},{"year":"0","key":"21"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1993.313363"},{"key":"20","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.1989.100747"},{"key":"2","first-page":"157","article-title":"quick scan chain diagnosis using signal profiling","author":"yang","year":"2005","journal-title":"Proc Int'l Conf on Computer Design"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966642"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/VDAT.2006.258152"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/54.970425"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2007.896939"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2005.848800"},{"key":"4","article-title":"a complete test set to diagnose scan chain failures","author":"guo","year":"2007","journal-title":"Proc Int'l Test Conf"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2007.364644"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1270854"}],"event":{"name":"2008 IEEE International Test Conference","start":{"date-parts":[[2008,10,28]]},"location":"Santa Clara, CA","end":{"date-parts":[[2008,10,30]]}},"container-title":["2008 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4690905\/4700527\/04700587.pdf?arnumber=4700587","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,6,27]],"date-time":"2020-06-27T03:48:37Z","timestamp":1593229717000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/4700587\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,10]]},"references-count":21,"URL":"https:\/\/doi.org\/10.1109\/test.2008.4700587","relation":{},"subject":[],"published":{"date-parts":[[2008,10]]}}}