{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T02:53:46Z","timestamp":1729652026409,"version":"3.28.0"},"reference-count":38,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2008,10]]},"DOI":"10.1109\/test.2008.4700588","type":"proceedings-article","created":{"date-parts":[[2008,12,10]],"date-time":"2008-12-10T12:55:58Z","timestamp":1228913758000},"page":"1-10","source":"Crossref","is-referenced-by-count":12,"title":["Diagnosis of design-silicon timing mismatch with feature encoding and importance ranking - the methodology explained"],"prefix":"10.1109","author":[{"given":"P.","family":"Bastani","sequence":"first","affiliation":[]},{"given":"N.","family":"Callegari","sequence":"additional","affiliation":[]},{"given":"L.-C.","family":"Wang","sequence":"additional","affiliation":[]},{"given":"M.S.","family":"Abadir","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"19","doi-asserted-by":"publisher","DOI":"10.1145\/1146909.1146915"},{"journal-title":"Incremental Dummy Metal Insertion","year":"2007","author":"lakshmanan","key":"35"},{"key":"17","article-title":"silicon symptoms to solutions: applying designfor-debug techniques","author":"pryon","year":"2002","journal-title":"ITC"},{"journal-title":"Method for Reducing Layer Revision in an Engineering Change Order","year":"2006","author":"tien","key":"36"},{"key":"18","first-page":"23","article-title":"design methodologies for the pa 71000lc microprocessor","volume":"46","author":"bass","year":"1995","journal-title":"Hewlett-Packard Journal"},{"key":"33","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2005.30"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041817"},{"key":"34","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805819"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805820"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/IWSTM.2000.869299"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966662"},{"key":"37","article-title":"automating post-silicon debugging and repair","author":"chang","year":"2007","journal-title":"ICCAD"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2004.1382597"},{"key":"38","article-title":"temperature-aware leakage minimization technique for real-time systesms","author":"yuan","year":"2006","journal-title":"ICCAD"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2000.838919"},{"key":"21","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2007.364645"},{"key":"20","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2004.1269216"},{"key":"22","doi-asserted-by":"publisher","DOI":"10.1145\/1065579.1065778"},{"key":"23","doi-asserted-by":"publisher","DOI":"10.1109\/VLSID.2006.148"},{"key":"24","doi-asserted-by":"publisher","DOI":"10.1109\/4.293110"},{"key":"25","doi-asserted-by":"publisher","DOI":"10.1145\/1146909.1146964"},{"key":"26","article-title":"speedpath prediction based on learning from small set of exmaples","author":"bastani","year":"0","journal-title":"DAC'08"},{"journal-title":"The Nature of Statistical Learning Theory","year":"1999","author":"vapnik","key":"27"},{"journal-title":"An Introduction to Support Vector Machine","year":"2002","author":"cristianini","key":"28"},{"key":"29","doi-asserted-by":"publisher","DOI":"10.1017\/CBO9780511809682"},{"key":"3","doi-asserted-by":"crossref","first-page":"384","DOI":"10.1145\/1278480.1278580","article-title":"design-silicon timing correlation a data mining perspective","author":"wang","year":"2007","journal-title":"2007 44th ACM\/IEEE Design Automation Conference DAC"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2003.1219124"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1049\/ip-cdt:20030834"},{"key":"1","article-title":"analysis of causation of speed failures in a microprocessor: a case study","author":"killpack","year":"0","journal-title":"IEEE Design & Test"},{"key":"30","doi-asserted-by":"publisher","DOI":"10.1023\/A:1010933404324"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.1980.1585231"},{"key":"6","article-title":"statistical diagnosis of unmodeled timing effect","author":"bastani","year":"2008","journal-title":"DAC"},{"key":"32","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2006.320116"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/VDAT.2008.4542422"},{"key":"31","doi-asserted-by":"publisher","DOI":"10.1145\/1233501.1233511"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2007.4437587"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1271092"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1998.743257"}],"event":{"name":"2008 IEEE International Test Conference","start":{"date-parts":[[2008,10,28]]},"location":"Santa Clara, CA","end":{"date-parts":[[2008,10,30]]}},"container-title":["2008 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4690905\/4700527\/04700588.pdf?arnumber=4700588","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,18]],"date-time":"2017-06-18T10:37:30Z","timestamp":1497782250000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4700588\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,10]]},"references-count":38,"URL":"https:\/\/doi.org\/10.1109\/test.2008.4700588","relation":{},"subject":[],"published":{"date-parts":[[2008,10]]}}}