{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,21]],"date-time":"2025-10-21T15:01:18Z","timestamp":1761058878412,"version":"3.28.0"},"reference-count":40,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2008,10]]},"DOI":"10.1109\/test.2008.4700605","type":"proceedings-article","created":{"date-parts":[[2008,12,10]],"date-time":"2008-12-10T12:55:58Z","timestamp":1228913758000},"page":"1-9","source":"Crossref","is-referenced-by-count":9,"title":["Modeling Test Escape Rate as a Function of Multiple Coverages"],"prefix":"10.1109","author":[{"given":"K.M.","family":"Butler","sequence":"first","affiliation":[]},{"given":"J.M.","family":"Carulli","sequence":"additional","affiliation":[]},{"given":"J.","family":"Saxena","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"19","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1995.529894"},{"key":"35","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805768"},{"key":"17","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1991.519695"},{"key":"36","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2005.1584030"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1992.527817"},{"key":"33","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2006.297735"},{"key":"15","first-page":"192","article-title":"correlating defect level to fault coverage for modular structured designs","author":"powell","year":"1994","journal-title":"Proc 1994 IEEE VLSI Test Symp"},{"key":"34","doi-asserted-by":"crossref","DOI":"10.1109\/TEST.2006.297736","article-title":"classifying bad chips and ordering test sets","author":"ferhani","year":"2006","journal-title":"Proc 2006 IEEE Int Test Conf"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1989.82352"},{"key":"39","first-page":"20","article-title":"fault simulation for structured vlsi design","volume":"6","author":"waicukauski","year":"1985","journal-title":"VLSI Systems Design"},{"journal-title":"A Simple Theoretical DPPM Estimation Tool","year":"1999","author":"stewart","key":"13"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/54.199804"},{"key":"37","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2006.53"},{"key":"11","doi-asserted-by":"crossref","first-page":"640","DOI":"10.1109\/DATE.2000.840853","article-title":"reducing the complexity of defect level modeling using the clustering effect","author":"de sousa","year":"2000","journal-title":"Proc Design Automation and Test in Europe"},{"key":"38","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1995.529891"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2005.1584088"},{"key":"21","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1996.510876"},{"key":"20","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1995.529895"},{"key":"40","doi-asserted-by":"publisher","DOI":"10.1109\/T-ED.1973.17719"},{"key":"22","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1996.556969"},{"key":"23","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1997.600334"},{"key":"24","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1997.639727"},{"key":"25","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1998.743133"},{"key":"26","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1998.743151"},{"key":"27","article-title":"elf35 experiment - chip and experiment design","author":"li","year":"1999","journal-title":"Stanford CRC Technical Report 99-3"},{"key":"28","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894232"},{"key":"29","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894237"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1982.1051686"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1981.1675742"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/EDTC.1996.494130"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1002\/j.1538-7305.1978.tb02107.x"},{"key":"30","first-page":"443","article-title":"scan vs. functional testing - a comparative effectiveness study on motorola's mmc2107tm","author":"tumin","year":"2001","journal-title":"Proc 2001 IEEE Int Test Conf"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1990.114087"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/41.19069"},{"key":"32","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2006.297624"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1988.207761"},{"key":"31","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2004.1299220"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.1984.1270065"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1991.519756"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1990.114123"}],"event":{"name":"2008 IEEE International Test Conference","start":{"date-parts":[[2008,10,28]]},"location":"Santa Clara, CA","end":{"date-parts":[[2008,10,30]]}},"container-title":["2008 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4690905\/4700527\/04700605.pdf?arnumber=4700605","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,5,16]],"date-time":"2019-05-16T00:23:15Z","timestamp":1557966195000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4700605\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,10]]},"references-count":40,"URL":"https:\/\/doi.org\/10.1109\/test.2008.4700605","relation":{},"subject":[],"published":{"date-parts":[[2008,10]]}}}