{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,27]],"date-time":"2025-10-27T15:57:28Z","timestamp":1761580648462},"reference-count":15,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2008,10]]},"DOI":"10.1109\/test.2008.4700619","type":"proceedings-article","created":{"date-parts":[[2008,12,10]],"date-time":"2008-12-10T12:55:58Z","timestamp":1228913758000},"page":"1-10","source":"Crossref","is-referenced-by-count":109,"title":["Optimized Circuit Failure Prediction for Aging: Practicality and Promise"],"prefix":"10.1109","author":[{"given":"M.","family":"Agarwal","sequence":"first","affiliation":[]},{"given":"V.","family":"Balakrishnan","sequence":"additional","affiliation":[]},{"given":"A.","family":"Bhuyan","sequence":"additional","affiliation":[]},{"family":"Kyunglok Kim","sequence":"additional","affiliation":[]},{"given":"B.C.","family":"Paul","sequence":"additional","affiliation":[]},{"family":"Wenping Wang","sequence":"additional","affiliation":[]},{"family":"Bo Yang","sequence":"additional","affiliation":[]},{"family":"Yu Cao","sequence":"additional","affiliation":[]},{"given":"S.","family":"Mitra","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"15","article-title":"compact modeling and simulation of circuit reliability for 65nm cmos technology","author":"wang","year":"2007","journal-title":"IEEE Trans Device and Materials Reliability"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1063\/1.1567461"},{"key":"14","doi-asserted-by":"crossref","first-page":"364","DOI":"10.1145\/1278480.1278573","article-title":"The Impact of NBTI on the Performance of Combinational and Sequential Circuits","author":"wenping wang","year":"2007","journal-title":"2007 44th ACM\/IEEE Design Automation Conference DAC"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2008.4484801"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.2008.4558940"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2006.229329"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2006.320885"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2007.22"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1145\/1403375.1403590"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2007.4419068"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2005.02.001"},{"key":"5","article-title":"simultaneous extraction of recoverable and permanent components contributing to biastemperature instability","author":"grasser","year":"2007","journal-title":"International Electron Device Meeting"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.2003.1197745"},{"key":"9","article-title":"managing process variation in intel's 45nm cmos technology","author":"kuhn","year":"2008","journal-title":"Intel Technology Journal"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2008.4700583"}],"event":{"name":"2008 IEEE International Test Conference","start":{"date-parts":[[2008,10,28]]},"location":"Santa Clara, CA","end":{"date-parts":[[2008,10,30]]}},"container-title":["2008 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4690905\/4700527\/04700619.pdf?arnumber=4700619","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,18]],"date-time":"2017-06-18T10:37:28Z","timestamp":1497782248000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4700619\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,10]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/test.2008.4700619","relation":{},"subject":[],"published":{"date-parts":[[2008,10]]}}}