{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T15:51:26Z","timestamp":1729612286557,"version":"3.28.0"},"reference-count":22,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2008,10]]},"DOI":"10.1109\/test.2008.4700629","type":"proceedings-article","created":{"date-parts":[[2008,12,10]],"date-time":"2008-12-10T12:55:58Z","timestamp":1228913758000},"page":"1-10","source":"Crossref","is-referenced-by-count":1,"title":["IEEE 1500 Core Wrapper Optimization Techniques and Implementation"],"prefix":"10.1109","author":[{"given":"B.","family":"Mullane","sequence":"first","affiliation":[]},{"given":"M.","family":"Higgins","sequence":"additional","affiliation":[]},{"given":"C.","family":"MacNamee","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"19","article-title":"fpga prototyping of a scan based system-on- chip design","author":"mullane","year":"2007","journal-title":"ReCoSoC2007 Montpellier France"},{"key":"22","doi-asserted-by":"crossref","first-page":"198","DOI":"10.1049\/cp:20080662","article-title":"IEEE 1500 wrapper control using an IEEE 1149.1 test access port.","author":"higgins","year":"2008","journal-title":"IET Irish Signals and Systems Conference (ISSC 2008) ISSC"},{"journal-title":"SoC Benchmark Files","year":"2004","key":"17"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041803"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS.2008.4538811"},{"journal-title":"IEEE Standard Test Access Port and Boundaryscan Architecture","year":"2001","key":"16"},{"journal-title":"Synopsys's Tetramax","year":"0","key":"13"},{"journal-title":"Mentor Graphics' FastScan","year":"0","key":"14"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/RME.2006.1690001"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/ISVLSI.2008.36"},{"journal-title":"Leon3 Processor IP","year":"0","key":"21"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805786"},{"journal-title":"National Instruments Labview Software","year":"0","key":"20"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2005.1584015"},{"journal-title":"Coverage Driven Verification of IEEE P1500-Compliant Embedded Core Test Infrastructures in Cadence Designers Network","year":"2005","author":"diamantidis","key":"1"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805772"},{"journal-title":"IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data-Core Test Language (CTL)","year":"2006","key":"7"},{"journal-title":"Design for Test for Digital IC's and Embedded Core Systems","year":"2000","author":"crouch","key":"6"},{"key":"5","doi-asserted-by":"crossref","DOI":"10.1007\/0-387-34609-0","volume":"35","author":"d silva","year":"2006","journal-title":"The Core Test Wrapper Handbook - Rationale and Application of IEEE Std 15OOTM"},{"journal-title":"IEEE Standard Testability Method for Embedded Core-Based Integrated Circuits","year":"2005","key":"4"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1023\/A:1014916913577"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894302"}],"event":{"name":"2008 IEEE International Test Conference","start":{"date-parts":[[2008,10,28]]},"location":"Santa Clara, CA","end":{"date-parts":[[2008,10,30]]}},"container-title":["2008 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4690905\/4700527\/04700629.pdf?arnumber=4700629","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,18]],"date-time":"2017-06-18T10:37:28Z","timestamp":1497782248000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4700629\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,10]]},"references-count":22,"URL":"https:\/\/doi.org\/10.1109\/test.2008.4700629","relation":{},"subject":[],"published":{"date-parts":[[2008,10]]}}}