{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T22:58:51Z","timestamp":1725663531748},"reference-count":12,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2008,10]]},"DOI":"10.1109\/test.2008.4700637","type":"proceedings-article","created":{"date-parts":[[2008,12,10]],"date-time":"2008-12-10T17:55:58Z","timestamp":1228931758000},"page":"1-8","source":"Crossref","is-referenced-by-count":2,"title":["Linearity Test Time Reduction for Analog-to-Digital Converters Using the Kalman Filter with Experimental Parameter Estimation"],"prefix":"10.1109","author":[{"given":"Jin","family":"Le","sequence":"first","affiliation":[]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/19.293454"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1984.1052232"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2006.297679"},{"journal-title":"International Technology Roadmap for Semiconductors","year":"2003","key":"1"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2002.803506"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2005.1584086"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2005.847240"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805804"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/19.772218"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/19.744658"},{"journal-title":"IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters","year":"2000","key":"11"},{"journal-title":"An introduction to the Kalman filter","year":"0","author":"welch","key":"12"}],"event":{"name":"2008 IEEE International Test Conference","start":{"date-parts":[[2008,10,28]]},"location":"Santa Clara, CA","end":{"date-parts":[[2008,10,30]]}},"container-title":["2008 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4690905\/4700527\/04700637.pdf?arnumber=4700637","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,6,27]],"date-time":"2020-06-27T03:48:38Z","timestamp":1593229718000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/4700637\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,10]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/test.2008.4700637","relation":{},"subject":[],"published":{"date-parts":[[2008,10]]}}}