{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T23:10:19Z","timestamp":1725491419279},"reference-count":18,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2008,10]]},"DOI":"10.1109\/test.2008.4700639","type":"proceedings-article","created":{"date-parts":[[2008,12,10]],"date-time":"2008-12-10T12:55:58Z","timestamp":1228913758000},"page":"1-9","source":"Crossref","is-referenced-by-count":8,"title":["A New Method for Measuring Aperture Jitter in ADC Output and Its Application to ENOB Testing"],"prefix":"10.1109","author":[{"given":"T.J.","family":"Yamaguchi","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"Kawabata","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"Soma","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"Ishida","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"K.","family":"Sawami","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"K.","family":"Uekusa","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"journal-title":"Signal Generator R&S SMA 100A Specifications Version 02 01","year":"2006","key":"17"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2006.1"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2001.923425"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2005.1583980"},{"journal-title":"Application Note AN-1558 Clocking High-Speed A\/D Converters National Semiconductor Corp","year":"2007","key":"13"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2003.812916"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1984.1052232"},{"journal-title":"Application Note AN-501 Aperture Uncertainty and ADC System Performance Analog Devices Inc","year":"1998","key":"12"},{"journal-title":"Principles of Data Conversion System Design","year":"1995","author":"razavi","key":"3"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/49.761034"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/4.50307"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2008.52"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2002.807799"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/19.728790"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1994.528023"},{"journal-title":"CMOS Mixed-Signal Circuit Design","year":"2002","author":"baker","key":"4"},{"journal-title":"Telecommunications Measurements Analysis and Instrumentation","year":"1987","author":"feher","key":"9"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2006.39"}],"event":{"name":"2008 IEEE International Test Conference","start":{"date-parts":[[2008,10,28]]},"location":"Santa Clara, CA","end":{"date-parts":[[2008,10,30]]}},"container-title":["2008 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4690905\/4700527\/04700639.pdf?arnumber=4700639","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,17]],"date-time":"2017-03-17T12:55:30Z","timestamp":1489755330000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4700639\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,10]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/test.2008.4700639","relation":{},"subject":[],"published":{"date-parts":[[2008,10]]}}}