{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,19]],"date-time":"2025-03-19T15:06:17Z","timestamp":1742396777418},"reference-count":6,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2008,10]]},"DOI":"10.1109\/test.2008.4700643","type":"proceedings-article","created":{"date-parts":[[2008,12,10]],"date-time":"2008-12-10T12:55:58Z","timestamp":1228913758000},"page":"1-8","source":"Crossref","is-referenced-by-count":6,"title":["The Advantages of Limiting P1687 to a Restricted Subset"],"prefix":"10.1109","author":[{"given":"J.","family":"Doege","sequence":"first","affiliation":[]},{"given":"A.L.","family":"Crouch","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","article-title":"using the jtag interface as a general-purpose communication port","author":"wallace","year":"2005","journal-title":"XCELL J Online"},{"journal-title":"IEEE Standard Test Access Port and Boundary-Scan Architecture","year":"2001","key":"2"},{"journal-title":"Design for Test for Digital IC's and Embedded Core Systems","year":"1999","author":"crouch alfred","key":"1"},{"journal-title":"IEEE P1687 Website","year":"0","key":"6"},{"journal-title":"IEEE Standard Verilog Hardware Description Language","year":"2001","key":"5"},{"journal-title":"IEEE Standard Testability Method for Embedded Core-Based Integrated Circuits","year":"2005","key":"4"}],"event":{"name":"2008 IEEE International Test Conference","start":{"date-parts":[[2008,10,28]]},"location":"Santa Clara, CA","end":{"date-parts":[[2008,10,30]]}},"container-title":["2008 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4690905\/4700527\/04700643.pdf?arnumber=4700643","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,17]],"date-time":"2017-03-17T14:02:22Z","timestamp":1489759342000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4700643\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,10]]},"references-count":6,"URL":"https:\/\/doi.org\/10.1109\/test.2008.4700643","relation":{},"subject":[],"published":{"date-parts":[[2008,10]]}}}