{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T13:03:23Z","timestamp":1725627803811},"reference-count":10,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2008,10]]},"DOI":"10.1109\/test.2008.4700649","type":"proceedings-article","created":{"date-parts":[[2008,12,10]],"date-time":"2008-12-10T17:55:58Z","timestamp":1228931758000},"page":"1-6","source":"Crossref","is-referenced-by-count":1,"title":["Jitter and Signal Integrity Verification for Synchronous and Asynchronous I\/Os at Multiple to 10 GHz\/Gbps"],"prefix":"10.1109","author":[{"given":"M.P.","family":"Li","sequence":"first","affiliation":[]}],"member":"263","reference":[{"key":"3","article-title":"statistical and system approaches for jitter, noise and bit error rate (ber) tests for high speed serial links and devices","author":"li","year":"2005","journal-title":"Proc Int'l Test Conf (ITC)"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1016\/B978-012373973-5.50019-X"},{"journal-title":"Jitter- Signal Integrity- Power- and Process-Optimized Transceivers","year":"0","key":"10"},{"journal-title":"Jitter noise and signal integrity at highspeed","year":"2007","author":"li","key":"1"},{"journal-title":"DDR2-SDRAM Specification","year":"2006","key":"7"},{"journal-title":"American National Standard for Information Technology Fibre Channel Physical Interface-4 (FC-PI-4) Rev 8 00","article-title":"incits working draft proposed","year":"2008","key":"6"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/EPEP.2007.4387143"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/EPEP.2006.321168"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2006.297698"},{"journal-title":"DDR3 SDRAM Specification","year":"2007","key":"8"}],"event":{"name":"2008 IEEE International Test Conference","start":{"date-parts":[[2008,10,28]]},"location":"Santa Clara, CA","end":{"date-parts":[[2008,10,30]]}},"container-title":["2008 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4690905\/4700527\/04700649.pdf?arnumber=4700649","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,17]],"date-time":"2017-03-17T17:55:34Z","timestamp":1489773334000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4700649\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,10]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/test.2008.4700649","relation":{},"subject":[],"published":{"date-parts":[[2008,10]]}}}