{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T05:32:50Z","timestamp":1725687170413},"reference-count":23,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2008,10]]},"DOI":"10.1109\/test.2008.4700650","type":"proceedings-article","created":{"date-parts":[[2008,12,10]],"date-time":"2008-12-10T17:55:58Z","timestamp":1228931758000},"page":"1-6","source":"Crossref","is-referenced-by-count":3,"title":["Jitters in high performance microprocessors"],"prefix":"10.1109","author":[{"given":"T.M.","family":"Mak","sequence":"first","affiliation":[]}],"member":"263","reference":[{"key":"19","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2007.31"},{"key":"22","doi-asserted-by":"publisher","DOI":"10.1109\/9780470545331"},{"key":"17","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2004.38"},{"key":"23","doi-asserted-by":"publisher","DOI":"10.1109\/4.918917"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.2005.1594283"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1109\/4.823449"},{"key":"16","first-page":"332","article-title":"an on-chip jitter measurement circuit for the pll","author":"tsai c - c","year":"2003","journal-title":"Proc of IEEE 12th Asian Test Symposium"},{"key":"13","article-title":"system-on-chip test architectures (systems on silicon)","author":"wang","year":"0","journal-title":"Chapter 10 Design for Silicon Debug"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1270826"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2003.821937"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2004.1332740"},{"key":"21","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2008.51"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/4.962284"},{"journal-title":"CMOS VLSI Design A Circuits and Systems Perspective","year":"2004","author":"weste","key":"20"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2001.912693"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/4.881198"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2001.934233"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2007.53"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2004.1275295"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966662"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2002.1015065"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2007.4437560"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2005.855104"}],"event":{"name":"2008 IEEE International Test Conference","start":{"date-parts":[[2008,10,28]]},"location":"Santa Clara, CA","end":{"date-parts":[[2008,10,30]]}},"container-title":["2008 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4690905\/4700527\/04700650.pdf?arnumber=4700650","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,17]],"date-time":"2017-03-17T17:55:34Z","timestamp":1489773334000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4700650\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,10]]},"references-count":23,"URL":"https:\/\/doi.org\/10.1109\/test.2008.4700650","relation":{},"subject":[],"published":{"date-parts":[[2008,10]]}}}