{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,11]],"date-time":"2025-06-11T05:43:06Z","timestamp":1749620586869},"reference-count":5,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2008,10]]},"DOI":"10.1109\/test.2008.4700654","type":"proceedings-article","created":{"date-parts":[[2008,12,10]],"date-time":"2008-12-10T17:55:58Z","timestamp":1228931758000},"page":"1-10","source":"Crossref","is-referenced-by-count":6,"title":["A Tutorial on STDF Fail Datalog Standard"],"prefix":"10.1109","author":[{"given":"A.","family":"Khoche","sequence":"first","affiliation":[]},{"given":"P.","family":"Burlison","sequence":"additional","affiliation":[]},{"given":"J.","family":"Rowe","sequence":"additional","affiliation":[]},{"given":"G.","family":"Plowman","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"journal-title":"BITMAP Test Data in STDF File","year":"2006","author":"constantino","key":"3"},{"journal-title":"Standard Test Data Format Specification Version 4 0","year":"0","key":"2"},{"journal-title":"ATE Data Collection-A comprehensive Requirements Proposal to Maximize ROI of Test","year":"2004","author":"rehnani","key":"1"},{"journal-title":"STDF Fail Datalog Standardization\" Streamlining The Dataflow For Volume Diagnosis","year":"2007","author":"khoche","key":"5"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2006.260956"}],"event":{"name":"2008 IEEE International Test Conference","start":{"date-parts":[[2008,10,28]]},"location":"Santa Clara, CA","end":{"date-parts":[[2008,10,30]]}},"container-title":["2008 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4690905\/4700527\/04700654.pdf?arnumber=4700654","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,17]],"date-time":"2017-03-17T16:09:00Z","timestamp":1489766940000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4700654\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,10]]},"references-count":5,"URL":"https:\/\/doi.org\/10.1109\/test.2008.4700654","relation":{},"subject":[],"published":{"date-parts":[[2008,10]]}}}